Orientation dependence of mechanically induced grain boundary migration in nano-grained copper

doi:10.1016/j.jmst.2020.08.018

Abstract

Abstract:

Tensile tests were carried out on gradient nanograined copper samples to investigate the grain orientation dependence of mechanically induced grain boundary migration (GBM) process. The relationship between GBM and the orientations of nanograins relative to loading direction was established by using electron backscatter diffraction. GBM is found to be more pronounced in the grains with higher Schmid factors where dislocations are easier to slip. As a result, the fraction of high angle grain boundaries decreases and that of low angle grain boundaries increases after GBM.

Key words: Grain boundary migration, Orientation dependence, Texture, Nano-grain, Copper

J.X. Hou, X.Y. Li, K. Lu. Orientation dependence of mechanically induced grain boundary migration in nano-grained copper[J]. J. Mater. Sci. Technol., 2021, 68: 30-34.

Figures/Tables 4

Fig. 1. (a) Schematic illustration of the SMGT set-up. Longitude-sectional SEM images of the surface layers in the as-prepared sample (b) and the as-tensioned sample (c), the dashed lines in (b), (c) represent the treated surfaces. (d) Variations of the microhardness as a function of depth from the surface in the as-prepared and as-tensioned samples.

Fig. 2. Typical bright-?eld longitude-sectional TEM images in the as-prepared sample (a) and the as-tensioned sample (b). (c) Grain size distributions of the as-prepared and as-tensioned samples.

Fig. 3. IPF (Inverse Pole Figure) mapping of the as-prepared sample (a) and as-tensioned sample (b). Corresponding IPF distribution—Contour of the as-prepared sample (c) and as-tensioned sample (d) obtained from EBSD data.

Fig. 4. Schmid factor mapping of as-prepared sample (a) and as-tensioned sample (b). (c) Schmid factor distribution of as-prepared sample, as-tensioned sample and random-oriented samples. (d) GB misorientation angle distribution of the as-prepared sample and as-tensioned sample.

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