[1]K.Arai and T.Suzuki:Light Metal,1981,31,675. [2]R.Bakish,E.Z.Border and R.J.Kornhass:J.Elec- trochem.Soc.,1962,109,791. [3]R.Bakish:Electrochem.Technol.,1968,6,192. [4]Z.Q.Zheng and W.B.Zhang:J.China Inst.South Inst. Mining Central Metal.,1983,1,111. [5]J.Jeong,C.H.Choi and D.Y.Lee:J.Mater.Sci.,1996, 31,5811. [6]Weimin MAO,Lei CHEN,Liman SA,Yongning YU and Yunfeng LI:Chin.J.Non.Ferrous Metals,2004, 14,1.(in Chinese) [7]R.B.Diegle:J.Electrochem.Soc.,1974,121,583. [8]X.Wu,P.Asoka-Kumar,K.G.Lynn and K.R.Hebert:J. Electrochem.Soc.,1994,141,3361. [9]K.Arai,T.Suzuki and T.Atsumi:J.Electrochem. Soc.,1985,132,1667. [10]R.B.Diegle:J.Electrochem.Soc.,1974,121,583. [11]X.Wu and K.Herbert:J.Electroehem.Soc.,1996, 143,83. [12]Z.Ashitaka,G.E.Thompson,P.Skeldon,H.Habazaki and K.Shimizu:J.Mater.Sci.,2001,36,2237. [13]O.Iwao,A.Mizuno,K.Yamaguchi and M.Mehata: Patent,561249,1987.(in Japanese) [14]T.Natori,M.Hosoda and Y.Ishi:Electrolytic Cond. Rev.,1997,47,48. [15]Jingbo SONG,Weimin MAO,Hong YANG and Huip- ing FENG:Transactions of Metal Heat Treatment, 2007,32(7),1.(in Chinese) [16]Ping YANG,Zuqing SUN and Weimin MAO:Chin.J. Stereology Image Analysis,2001,6,50.(in Chinese) [17]Zheng WANG,Yongming CAO,Yuesheng LI and Peiyuan FANG:Shanghai Computational Measure- ment,2003,30,42.(in Chinese) [18]Z.Ashitaka,G.E.Thompson,P.Skeldon,G.C.Wood and K.Shimizu:J.Electrochem.Soc.,1999,146, 1380. [19]K.Tada and K.Awaya:J.Jpn.Inst.Light Metals, 2000,50(11),590. [20]Y.Minamino,T.Yasuda,H.Araki and T.Yasuda:J. Defect Diffusion Forum,1989,66-69,1251. [21]J.P.Hirsh and J.Lothe:Theory of Dislocations,2nd ED.,John Wiley & Sons,1982,838. [22]J.Scherer,O.M.Magnussen,T.Ebel and R.J.Behm:J. Corros.Sci.,1999,41,51. [23]W.Lin,G.C.Tu,C.F.Lin and Y.M.Peng:J.Corros. Sci.,1996,38,902. [24]W.Lin,G.C.Tu,C.F.Lin and Y.M.Peng:J.Corros. Sci.,1997,39,1540. |