J. Mater. Sci. Technol. ›› 2013, Vol. 29 ›› Issue (7): 647-651.DOI: 10.1016/j.jmst.2013.03.005

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Substrate Temperature Dependent Properties of Cu Doped NiO Films Deposited by DC Reactive Magnetron Sputtering

Yarraguntla Ashok Kumar Reddy1), Akepati Sivasankar Reddy2), Pamanji Sreedhara Reddy1)   

  1. 1) Department of Physics, Sri Venkateswara University, Tirupathi 517502, India
    2) Division of Advanced Materials Engineering, Kongju National University, Budaedong, Cheonan City, South Korea
  • Received:2012-11-21 Revised:2012-01-22 Online:2013-07-30 Published:2013-06-08
  • Contact: P. Sreedhara Reddy
  • Supported by:

    University Grants Commission (UGC), New Delhi (File No. F.40-419/2011(SR))

Abstract:

The NiO–Cu composite films were deposited on a glass substrate at various substrate temperatures by DC reactive magnetron sputtering technique. The effect of substrate temperature on the structural, optical, morphological and electrical properties of the films was mainly investigated. X-ray diffraction studies revealed that when the substrate temperature increased to above 200 °C, the preferred orientation tended to move to another preferred site from (220) to (111) and had a stable cubic structure. The optical transmittance and band gap values increased with increasing substrate temperature. From the morphological studies, it was observed that the grain size and root mean square roughness were increased with increasing substrate temperature. The electrical resistivity of the film decreased to 0.017 Ω cm at high substrate temperature of 400 °C.

Key words: Sputtering, NiOeCu composite films, Substrate temperature, Crystallite size, Electrical resistivity