J. Mater. Sci. Technol. ›› 2021, Vol. 92: 21-30.DOI: 10.1016/j.jmst.2021.03.034
• Research Article • Previous Articles Next Articles
Fengyou Wanga,b,c, Jinyue Dua, Yuhong Zhanga, Meifang Yanga, Donglai Hand, Lili Yanga,b,c,*(
), Lin Fana,b,c, Yingrui Suia,b,c, Yunfei Suna, Jinghai Yanga,b,c,*()
Received:2020-12-24
Revised:2021-02-22
Accepted:2021-03-11
Published:2021-11-30
Online:2021-05-08
Contact:
Lili Yang,Jinghai Yang
About author:jhyang1@jlnu.edu.cn (J. Yang).Fengyou Wang, Jinyue Du, Yuhong Zhang, Meifang Yang, Donglai Han, Lili Yang, Lin Fan, Yingrui Sui, Yunfei Sun, Jinghai Yang. Upgraded antisolvent engineering enables 2D@3D quasi core-shell perovskite for achieving stable and 21.6% efficiency solar cells[J]. J. Mater. Sci. Technol., 2021, 92: 21-30.
Fig. 1. The schematic diagram of current two mainstream strategies for constructing the 2D-3D perovskite. The strategy 1 is to mix the 2D- and 3D- perovskite precursors, therefore the final phase distribution is randomly in the hybrid film. The strategy 2 is to sequential deposit the 3D- and 2D- perovskite, which could geometrically separate the 2D- and 3D- phase. However, the solvent in the 2D perovskite precursor can corrode the as-prepared 3D perovskite, thus making the 2D/3D interface to be defects-rich.
Fig. 2. Surface morphology of the perovskite films. (a) Schematic diagram of the upgraded antisolvent process. (b-e) SEM and (f-i) AFM images of the perovskite films prepared by control, M-1, M-3 and M-5 antisolvent, respectively. The RMS roughness values are 25.6, 16.9, 13.3 and 10.4 nm, respectively.
Fig. 3. (a) XRD patterns and (b) the I110/I310 intensity ratios of perovskite films prepared by control, M-1, M-3 and M-5 antisolvent, respectively. The XRD of the PEAI powder was also shown at the bottom. (c) The UV-vis absorption spectra of perovskite films prepared by control, M-1, M-3 and M-5 antisolvent, respectively.
Fig. 4. Analyzing the crystallization process of the films. (a) the absorption and images of the different precursors. (b) TD-XRD patterns of the M-1 film. The temperature is increased from 20 to 100 °C. (c) (200) peak intensity of the PEA2Pb4 under different temperature. (d) Schematic diagram of the crystallization model for the perovskite films. (d) GIXRD patterns of the perovksite film. The incident angle is increased from 0.4° to 2.5°
Fig. 5. (a) The cross-section SEM and linear-scan EDS image of PSCs. (b) XPS spectra of Pb 4f for control, 2D@3D and 2-min etched 2D@3D perovskite films. The right schematic diagram depicts the testing model in this case. (c) Cross-sectional HR-TEM of the perovskite film and the schematic illustration of the 2D@3D- architectured perovskite.
Fig. 6. (a) Dark current-voltage (J-V) curves of the device with Glass/FTO/SnO2/ perovskite/PCBM/Ag configuration. (b) The TPV decay curves of the control and 2D@3D perovskite films. (c, d) TRPL decay and PL spectra of the control and 2D@3D perovskite films, respectively.
Fig. 7. (a) The onset region and (b) the cut-off region of UPS spectra for control and 2D@3D perovskite films. The corresponding distance between VBM and Ef is 0.72 eV, and the Ef values for control and 2D@3D perovskite films are 4.71 eV (21.22-16.51 eV) and 4.57 eV (21.22-16.65 eV), respectively. (c) The PL spectra of different perovskite/Spiro-OMeTAD films on a glass substrate.
Fig. 8. Device architecture and photovoltaic performance. (a) The J-V curves of the PSCs based on the control and 2D@3D under forward and reverse scanning directions. (b) The EQE and integrated current density of the solar cells. (c) The PSCs based on the control and 2D@3D at constant bias voltages of 0.94 and 0.96 V, respectively. (d) PCEs depiction of the PSCs with control and 2D@3D perovskite photo-absorber for 42 devices.
Fig. 9. Stability of the PSCs. (a) The humidity test chamber is assembled with a hygrometer, a bottle with deionized water and a sealed box. Humidity of 50%±5% was created in a closed vessel. The photographs of control and 2D@3D perovskite films exposed in that environment for 45 d (b) The perovskite crystallinity evolution of XRD patterns for control and 2D@3D. The stability test of devices as a performance of storage time in different ambience: (c) in air with a humidity of 50%±5%; (d) at a constant heating temperature of 85 °C.
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