[1] B. Jaffe, W.R. Cook, J.R. Jaffe, H. Jaffe, Piezoelectric Ceramics, Academic Press, New York, 1971. [2] J. Rödel, W. Jo, K. Seifert, E. Anton, T. Granzow, D. Damjanovic, J. Am. Ceram. Soc. 92 (2009) 1153-1177. [3] G.Z. Zang, J.F. Wang, H.C. Chen, W.B. Su, C.M. Wang, P. Qi, B. Q. Ming, J. Du, L.M. Zheng, S. Zhang, T.R. Shrout, Appl. Phys. Lett. 88 (2006) 212908. [4] EU-Directive 2002/96/EC, Waste Electrical and Electronic Equipment (WEEE), Off. J. Eur. Union 46 (2003) 24-38. [5] EU-Directive 2002/95/EC, Restriction of the use of certain hazardous substances in electrical and electronic equipment (RoHS), Off. J. Eur. Union 46 (2003) 19-23. [6] Y. Saito, H. Takao, T. Tani, T. Nonoyama, K. Takatori, T. Homma, T. Nagaya, M. Nakamura, Nature 432 (2004) 84-87. [7] Y. Guo, K. Kakimoto, H. Ohsato, Appl. Phys. Lett. 85 (2004) 4121-4123. [8] K. Shibata, F. Oka, A. Ohisi, T. Mishima, I. Kanno, Appl. Phys. Express 1 (2008) 011501. [9] K. Tanaka, H. Hayashi, K. Kakimoto, H. Ohsato, T. Iijima, Jpn. J. Appl. Phys. 46 (2007) 6964-6970. [10] Y. Kizaki, Y. Noguchi, M. Miyayama, Appl. Phys. Lett. 89 (2006) 142910. [11] G. Shirane, R. Newnham, R. Pepinsky, Physiol. Rev. 96 (1954) 581-588. [12] S. Tashiro, H. Nagamatzu, K. Nagata, Jpn. J. Appl. Phys. 41 (2002) 7113-7118. [13] Y. Nakashima, W. Sakamoto, T. Shimura, T. Yogo, Jpn. J. Appl. Phys. 46 (2007) 6971-6975. [14] X. Wang, U. Helmersson, S. Olafsson, S. Rudner, L.D. Wernlund, S. Gevorgian, Appl. Phys. Lett. 73 (1998) 927-929. [15] C.R. Cho, A. Grishin, Appl. Phys. Lett. 75 (1999) 268-270. [16] F. Söderlind, P.O. Käll, U. Helmersson, J. Cryst. Growth 281 (2005) 468-474. [17] K. Tanaka, K. Kakimoto, H. Ohsato, J. Cryst. Growth 294 (2006) 209-213. [18] W. Sakamoto, Y. Mizutani, N. Iizawa, T. Yogo, T. Hayashi, S. Hirano, J. Eur. Ceram. Soc. 25 (2005) 2305-2308. [19] W. Sakamoto, Y. Mizutani, N. Iizawa, T. Yogo, T. Hayashi, S. Hirano, J. Electroceram. 17 (2006) 293-297. [20] X. Yan, W. Ren, X. Wu, P. Shi, X. Yao, J. Alloy. Compd. 508 (2010) 129-132. [21] P.C. Goh, K. Yao, J. Am. Ceram. Soc. 92 (2009) 1322-1327. [22] L. Wang, W. Ren, K. Yao, P.C. Goh, P. Shi, X. Wu, X. Yao, J. Am. Ceram. Soc. 93 (2010) 3686-3690. [23] C.W. Ahn, H.I. Hwang, K.S. Lee, B.M. Jin, S.M. Park, G.S. Park, D.H. Yoon, H.S. Cheong, H.J. Lee, I.W. Kim, Jpn. J. Appl. Phys. 49 (2010) 095801. [24] R.W. Schwartz, T. Schneller, R. Waser, C.R. Chimie 7 (2004) 433-461. [25] F. Lai, J.F. Li, J. Sol-Gel Sci. Technol. 42 (2007) 287-292. [26] S. Wiegand, S. Flege, O. Baake, W. Ensinger, Bull. Mater. Sci. 35 (2012) 745-750. [27] S. Wiegand, S. Flege, O. Baake, W. Ensinger, J. Mater. Sci. Technol. 28 (2012) 500-505. [28] C. Kang, J.H. Park, D. Shen, H. Ahn, M. Park, D.J. Kim, J. Sol-Gel Sci. Technol. 58 (2011) 85-90. [29] L. Wang, K. Yao, W. Ren, Appl. Phys. Lett. 93 (2008) 092903. [30] A. Kupec, B. Malic, J. Tellier, E. Tchernychova, S. Glinsek, M. Kosec, J. Am. Ceram. Soc. 95 (2012) 515-523. [31] C.W. Ahn, S.Y. Lee, A. Ullah, J.S. Bae, E.D. Jeong, J.S. Choi, B. H. Park, I.W. Kim, J. Physiol. D 42 (2009) 215304. |