J. Mater. Sci. Technol. ›› 2020, Vol. 50: 215-244.DOI: 10.1016/j.jmst.2020.03.011
• Research Article • Previous Articles Next Articles
Mohammad Nasima, Yuncang Lia, Ming Wenb, Cuie Wena,*()
Received:
2019-11-08
Revised:
2020-01-11
Accepted:
2020-01-11
Published:
2020-08-01
Online:
2020-08-10
Contact:
Cuie Wen
Mohammad Nasim, Yuncang Li, Ming Wen, Cuie Wen. A review of high-strength nanolaminates and evaluation of their properties[J]. J. Mater. Sci. Technol., 2020, 50: 215-244.
Fig. 5. (a) SEM cross-section in backscattered mode illustrating multilayer structure of Al2O3/ZrO2 nanolaminate (dark layers correspond to Al2O3 and bright layers correspond to ZrO2); and (b) TEM lattice-fringe image showing interface between an alumina and a zirconia grain (zirconia and alumina are indicated with no intergranular phase) [57].
Nanolaminate fabrication techniques | Advantages | Limitations |
---|---|---|
Physical vapor deposition (PVD) | - better control of the layer composition and thickness during nanolaminate fabrication - magnetron sputtering can produce high-quality and low-impurity metal and ceramic nanolaminates - higher deposition rate - good adhesion between individual layers in nanolaminate structures - magnetron sputtering can operate at lower deposition temperatures even at room temperature, which overcomes the difficulties of using lower melting temperature substrates | - it requires high vacuum to fabricate nanolaminates |
Atomic layer deposition (ALD) | - it can control the thickness on the atomic scale during nanolaminate fabrication - has option to select wide range of precursor materials - good for relatively high-density material deposition with low impurity | - it requires modest temperature (<350 °C) to fabricate nanolaminates. Outside of the temperature range poor deposition is occurred due to either lower deposition rate or thermal decomposition of precursors. |
Electrodeposition (ED) | - technologically simple structure of the system - compositional and structural changes of nanolaminates can be made by varying the deposition parameters - dual-bath ED technique overcomes the limitation of choosing wide range alloy compositions | - deposition parameters can be varied during the deposition and adversely affect the nanolaminate structures - single-bath ED technique suffers due to the selection of limited materials - dual-bath ED technique arises complexity and undesirable surface reactions during transferring the substrate between two electrolytes - possibility of high impurity and blunt interface structures in nanolaminates |
Chemical vapor deposition (CVD) | - PE-CVD is advantageous due to its low temperature deposition, even it can operate at ambient temperature | - limited usages of low melting temperature substrates in thermal CVD process - interfaces between the layers of nanolaminates are not sharp enough due to the diffusion at high temperatures - lower deposition rate than PVD |
Accumulative roll bonding (ARB) | - favorable for continuous production of nanolaminates - low cost and high production rate | - atomically smooth and few nm alternate layers in nanolaminates may not be achieved |
Table 1 Summary of the advantages and limitations among different fabrication techniques of nanolaminates.
Nanolaminate fabrication techniques | Advantages | Limitations |
---|---|---|
Physical vapor deposition (PVD) | - better control of the layer composition and thickness during nanolaminate fabrication - magnetron sputtering can produce high-quality and low-impurity metal and ceramic nanolaminates - higher deposition rate - good adhesion between individual layers in nanolaminate structures - magnetron sputtering can operate at lower deposition temperatures even at room temperature, which overcomes the difficulties of using lower melting temperature substrates | - it requires high vacuum to fabricate nanolaminates |
Atomic layer deposition (ALD) | - it can control the thickness on the atomic scale during nanolaminate fabrication - has option to select wide range of precursor materials - good for relatively high-density material deposition with low impurity | - it requires modest temperature (<350 °C) to fabricate nanolaminates. Outside of the temperature range poor deposition is occurred due to either lower deposition rate or thermal decomposition of precursors. |
Electrodeposition (ED) | - technologically simple structure of the system - compositional and structural changes of nanolaminates can be made by varying the deposition parameters - dual-bath ED technique overcomes the limitation of choosing wide range alloy compositions | - deposition parameters can be varied during the deposition and adversely affect the nanolaminate structures - single-bath ED technique suffers due to the selection of limited materials - dual-bath ED technique arises complexity and undesirable surface reactions during transferring the substrate between two electrolytes - possibility of high impurity and blunt interface structures in nanolaminates |
Chemical vapor deposition (CVD) | - PE-CVD is advantageous due to its low temperature deposition, even it can operate at ambient temperature | - limited usages of low melting temperature substrates in thermal CVD process - interfaces between the layers of nanolaminates are not sharp enough due to the diffusion at high temperatures - lower deposition rate than PVD |
Accumulative roll bonding (ARB) | - favorable for continuous production of nanolaminates - low cost and high production rate | - atomically smooth and few nm alternate layers in nanolaminates may not be achieved |
Fig. 7. Schematic representation of nanolaminate grain morphologies of: (a) equiaxed grains, (b) compressed grains, and (c) superlattice columnar structures.
Fig. 8. HRTEM images of: (a) (111)fcc‖(110)bcc K-S interface in Cu/Nb nanolayered composite and (b) (111)fcc‖(110)bcc N-W interface in Cu/Nb nanolayered composite [88].
Fig. 9. (a) Typical microstructures of Ag/Cu nanolamellar composites processed by high-pressure torsion (HPT) (arrows indicate twins), (b) HRTEM images of profuse deformation of twinning and stacking faults (SFs) in Ag nanolayers, (c) a deformation twin nucleated from an interface on Cu nanolayers (as indicated by arrow), and (d) a deformation twin in an Ag nanolayer that crossed the interface and propagated in the neighboring Cu nanolayers [94].
Fig. 10. (a) Comparison of hardness vs. h-1/2 plots for various fcc/bcc metallic multilayer systems, including Cu/Cr, Cu/Nb, Cu/V and Al/Nb, where h is individual layer thickness [29] and (b) hardness as a function of volume fraction of amorphous layers in C/A multilayers [37].
Nanolaminates | Crystal structure | Layer thickness, h (nm) | Peak hardness, Hmax (GPa) | References |
---|---|---|---|---|
Cu/Nb | fcc/bcc | 1.2 | 7.02 | [ |
Cu/Ag | fcc/fcc | 2.5 | 4.5 | [ |
Cu/Ni | fcc/fcc | 1.75 | 6.83 | [ |
Ag/Ni | fcc/fcc | 4 | 2.38 | [ |
Cu/Cr | fcc/bcc | 10 | 6.8 | [ |
Cu/V | fcc/bcc | 2.5 | 5.2 | [ |
Al/Nb | fcc/bcc | 1 | 4.8 | [ |
Cu/Au | fcc/fcc | 25 | 2.45 | [ |
Cu/Co | fcc/hcp | 1 | 6 | [ |
Cu/W | fcc/bcc | 4 | 8.9 | [ |
Cu/Ru | fcc/hcp | 5 | 8.1 | [ |
Cu/Zr | fcc/hcp | 5 | 5.8 | [ |
Cu/Ta | fcc/bcc | 30 | 7 | [ |
Mg/Nb | hcp/bcc | 5 | 2.7 | [ |
Mg/Ti | hcp/hcp | 2.5 | 4.2 | [ |
Zr/Nb | hcp/bcc | 30 | 5.31 | [ |
Table 2 Comparison of peak hardness of different crystal-structured nanolaminates with different h.
Nanolaminates | Crystal structure | Layer thickness, h (nm) | Peak hardness, Hmax (GPa) | References |
---|---|---|---|---|
Cu/Nb | fcc/bcc | 1.2 | 7.02 | [ |
Cu/Ag | fcc/fcc | 2.5 | 4.5 | [ |
Cu/Ni | fcc/fcc | 1.75 | 6.83 | [ |
Ag/Ni | fcc/fcc | 4 | 2.38 | [ |
Cu/Cr | fcc/bcc | 10 | 6.8 | [ |
Cu/V | fcc/bcc | 2.5 | 5.2 | [ |
Al/Nb | fcc/bcc | 1 | 4.8 | [ |
Cu/Au | fcc/fcc | 25 | 2.45 | [ |
Cu/Co | fcc/hcp | 1 | 6 | [ |
Cu/W | fcc/bcc | 4 | 8.9 | [ |
Cu/Ru | fcc/hcp | 5 | 8.1 | [ |
Cu/Zr | fcc/hcp | 5 | 5.8 | [ |
Cu/Ta | fcc/bcc | 30 | 7 | [ |
Mg/Nb | hcp/bcc | 5 | 2.7 | [ |
Mg/Ti | hcp/hcp | 2.5 | 4.2 | [ |
Zr/Nb | hcp/bcc | 30 | 5.31 | [ |
Fig. 11. (a) Dependence of indentation modulus on h for Cu/Nb nanolaminates (modulus of Cu and Nb films also shown by dashed line for Cu and dotted line for Nb) [33]; (b) cross-section HRTEM image of Cu/W nanolaminates with 8 nm periodicity [73].
Fig. 13. (a) Dependence of ?C on hCu for Cu/Nb and Cu/Zr multilayers with ? = 1.0 and on h for single-layer Nb and Zr films [12], and (b) true stress-strain curves from uniaxial compression tests of Cu/Zr micropillars with five different h, where the average diameter of micropillars is 600 nm [106].
Materials | T =23 °C | T = 100 °C | ||
---|---|---|---|---|
E (GPa) | H (GPa) | E (GPa) | H (GPa) | |
Al | 88 ± 6 | 0.91 ± 0.04 | 70 ± 3 | 0.60 ± 0.02 |
SiC | 297 ± 7 | 35.6 ± 0.7 | 320 ± 3 | 30.8 ± 0.8 |
Al/SiC | 128 ± 7 | 4.9 ± 0.5 | 118 ± 11 | 3.7 ± 0.4 |
Table 3 Elastic modulus E and hardness H measured from instrumented nano-indentation test in monolithic Al and SiC layers and Al/SiC multilayers at 23 °C and 100 °C temperature [150].
Materials | T =23 °C | T = 100 °C | ||
---|---|---|---|---|
E (GPa) | H (GPa) | E (GPa) | H (GPa) | |
Al | 88 ± 6 | 0.91 ± 0.04 | 70 ± 3 | 0.60 ± 0.02 |
SiC | 297 ± 7 | 35.6 ± 0.7 | 320 ± 3 | 30.8 ± 0.8 |
Al/SiC | 128 ± 7 | 4.9 ± 0.5 | 118 ± 11 | 3.7 ± 0.4 |
Sample | Hardness (GPa) | |||
---|---|---|---|---|
28°C | 50°C | 100°C | 150°C | |
Al10/SiC50 | 9.7 ± 0.1 | 9.2 ± 0.3 | 7.4 ± 0.1 | 6.1 ± 0.2 |
Al25/SiC50 | 8.1 ± 0.5 | 7.2 ± 0.2 | 5.2 ± 0.1 | 4.0 ± 0.1 |
Al50/SiC50 | 5.7 ± 0.3 | 5.3 ± 0.1 | 3.9 ± 0.2 | 3.1 ± 0.3 |
Al100/SiC50 | 5.5 ± 0.4 | 5.2 ± 0.4 | 4.2 ± 0.3 | 3.6 ± 0.2 |
Al50/SiC2 | 3.3 ± 0.2 | 2.8 ± 0.1 | 1.5 ± 0.1 | 1.2 ± 0.1 |
Al50/SiC10 | 4.1 ± 0.1 | 3.6 ± 0.2 | 2.6 ± 0.1 | 2 ± 0.1 |
Al50/SiC25 | 4.8 ± 0.1 | 4.4 ± 0.2 | 3.5 ± 0.2 | 2.7 ± 0.2 |
Al50/SiC100 | 7.6 ± 0.3 | 7.2 ± 0.3 | 5.4 ± 0.1 | 4.0 ± 0.2 |
Table 4 Effects of h and temperature on the hardness of different Al/SiC nanolaminates [151].
Sample | Hardness (GPa) | |||
---|---|---|---|---|
28°C | 50°C | 100°C | 150°C | |
Al10/SiC50 | 9.7 ± 0.1 | 9.2 ± 0.3 | 7.4 ± 0.1 | 6.1 ± 0.2 |
Al25/SiC50 | 8.1 ± 0.5 | 7.2 ± 0.2 | 5.2 ± 0.1 | 4.0 ± 0.1 |
Al50/SiC50 | 5.7 ± 0.3 | 5.3 ± 0.1 | 3.9 ± 0.2 | 3.1 ± 0.3 |
Al100/SiC50 | 5.5 ± 0.4 | 5.2 ± 0.4 | 4.2 ± 0.3 | 3.6 ± 0.2 |
Al50/SiC2 | 3.3 ± 0.2 | 2.8 ± 0.1 | 1.5 ± 0.1 | 1.2 ± 0.1 |
Al50/SiC10 | 4.1 ± 0.1 | 3.6 ± 0.2 | 2.6 ± 0.1 | 2 ± 0.1 |
Al50/SiC25 | 4.8 ± 0.1 | 4.4 ± 0.2 | 3.5 ± 0.2 | 2.7 ± 0.2 |
Al50/SiC100 | 7.6 ± 0.3 | 7.2 ± 0.3 | 5.4 ± 0.1 | 4.0 ± 0.2 |
Fig. 15. Schematic of a crack: (a) lying on an interface, (b) on a plane within a layer parallel to the interface, (c) in the edge orientation, and (d) in the surface orientation.
Fig. 16. (a) Schematic of micro-mechanical fracture model, and (b) model predicting ?max at different normalized cohesive strengths ($\tilde{\sigma }$ c) as a function of hCu [12].
Fig. 18. Schematic of CLS mechanism in nanolaminate structures: glide of dislocation loops in individual layers results in dislocations of deposited interfaces [167].
Fig. 19. Schematic representation of CLS model in A/B multilayer (slip nucleation shown in one layer): (a) dislocation deposited at interface due to glide of dislocation loops confined to layer A (dotted line represents slip plane and dislocation motion is normal to plane of view); (b) introducing CLS activity on two different slip systems, where adjacent segments (labeled 1 and 2) would produce dislocations with Burgers vectors in the interface plane labeled 3 in.(c); (c) new glide loops appear in layer A, experience repulsion from array of edge dislocations formed at interface [28].
Fig. 22. SEM images of residual indentation morphologies for: (a) (CuZr)10Cu18, (b) (CuZr)20Cu18, (c) (CuZr)75Cu18 and (d) (CuZr)200Cu18 nanolaminates [37].
Fig. 24. SEM cross-sectional view of shear deformation morphologies under microindented Au-Cu multilayers: (a) λ = 25 nm, and (c) λ = 250 nm under load of 250 mN for 5 s, magnified images of (b) and (d) from squared area in (a) and (c) respectively, show different shear deformation characteristics at different length scales [190].
Fig. 25. SEM images of two multilayers: (a) Ni/Ag multilayer, where light layers are Ag and dark layers are Ni; specimen was annealed at 600 °C for 72 h, where breakdown of Ni layers occurred, and (b) Cu/Nb multilayer, where light layers are Nb and dark layers are Cu, specimen was annealed at 800 °C for 3 h, where pinch-off happened in Nb layers [191].
Fig. 26. Transmission electron micrographs showing cross-sectional views of microstructures of 75 nm Cu/Nb multilayers at: (a) 600 °C, and (b) 800 °C temperatures; alignment of grain boundaries along a vertical line is indicated by white arrows in (a), where grooving and shear of layers at triple points are shown in (b) [192].
Fig. 28. Polycrystalline Ag/Ni multilayers with numerous groove angles, where the groove angle depends on the orientation of each grain at triple junction [191].
Fig. 29. Reflectance (ρ) according to wavelengths (λ) for two different spectrally selective surfaces of Ti-TiNyOx and Cr-Cr2O3 on copper substrate [145].
Optimized sample | Thickness (nm) | Metal content (NC) | Absorbance (α) | Thermal emittance (?) |
---|---|---|---|---|
Top layer | 85 | 0 | 0.969 | - |
Middle layer | 86 | 0.005 | 0.921 | - |
Base layer | 72 | 0.5 | 0.763 | - |
Total | 243 | 0.969 | 0.047 |
Table 5 Data of an optimized sample for absorbance and thermal emittance [147].
Optimized sample | Thickness (nm) | Metal content (NC) | Absorbance (α) | Thermal emittance (?) |
---|---|---|---|---|
Top layer | 85 | 0 | 0.969 | - |
Middle layer | 86 | 0.005 | 0.921 | - |
Base layer | 72 | 0.5 | 0.763 | - |
Total | 243 | 0.969 | 0.047 |
Fig. 30. (a) Standard Mo-Si multilayers consisting of alternating Mo and Si layers and terminated with an Si layer, and (b) interface-engineered multilayers consisting of Mo and Si layers separated with thin boron carbide layers, where their capping layer presented in this paper is Si [199].
Fig. 31. Reflectance of interface-engineered Mo-Si multilayers at 12.7 and 13.5 nm wavelengths, where measurements were done at 5° off normal. Both consist of 50-bilayer Mo-Si multilayers with boron carbide interfaces [199].
Fig. 32. Microstructures of ARB Cu-Nb composites for: (a) 16 nm at room temperature, (b) 58 nm at room temperature, (c) 16 nm at 450 °C and (d) 58 nm at 450 °C [204].
Current density (A/dm2) | No. of layers | Potential vs Ag, AgCl / KCLsalt (V) | Icorr (μA/cm2) | Corrosion rate (× 10-2 mm y-1) |
---|---|---|---|---|
1.0-4.0 | 10 | -0.914 | 6.554 | 13.33 |
20 | -0.881 | 4.580 | 6.791 | |
60 | -1.003 | 3.067 | 4.550 | |
120 | -0.823 | 2.539 | 3.767 | |
300 | -0.799 | 1.2225 | 1.816 | |
600 | -1.176 | 10.129 | 15.02 | |
2.0-5.0 | 10 | -0.911 | 7.555 | 11.20 |
20 | -0.956 | 2.634 | 3.902 | |
60 | -0.938 | 1.397 | 2.073 | |
120 | -0.928 | 1.153 | 1.170 | |
300 | -0.942 | 0.379 | 0.502 | |
600 | -0.968 | 4.046 | 6.00 |
Table 6 Decrease in corrosion rate with increasing number of layers for CMMA Zn/Ni coating system [216].
Current density (A/dm2) | No. of layers | Potential vs Ag, AgCl / KCLsalt (V) | Icorr (μA/cm2) | Corrosion rate (× 10-2 mm y-1) |
---|---|---|---|---|
1.0-4.0 | 10 | -0.914 | 6.554 | 13.33 |
20 | -0.881 | 4.580 | 6.791 | |
60 | -1.003 | 3.067 | 4.550 | |
120 | -0.823 | 2.539 | 3.767 | |
300 | -0.799 | 1.2225 | 1.816 | |
600 | -1.176 | 10.129 | 15.02 | |
2.0-5.0 | 10 | -0.911 | 7.555 | 11.20 |
20 | -0.956 | 2.634 | 3.902 | |
60 | -0.938 | 1.397 | 2.073 | |
120 | -0.928 | 1.153 | 1.170 | |
300 | -0.942 | 0.379 | 0.502 | |
600 | -0.968 | 4.046 | 6.00 |
Fig. 33. SEM images of CMMA (Zn-Ni) coatings: (a) cross-sectional view showing 10 layers, and (b) surface morphology of 4 layered CMMA (Zn/Ni) after corrosion test [216].
[1] |
P. Dayal, N. Savvides, M. Hoffman, Thin Solid Films 517 (2009) 3698-3703.
DOI URL |
[2] |
R. Costescu, D. Cahill, F. Fabreguette, Z. Sechrist, S. George, Science 303 (2004) 989-990.
DOI URL PMID |
[3] |
S. Vepřek, J. Vac. Sci. Technol. A 17 (1999) 2401-2420.
DOI URL |
[4] |
P.C. Yashar, W.D. Sproul, Vacuum 55 (1999) 179-190.
DOI URL |
[5] |
G. Chen, Phys. Rev. B 57 (1998) 14958.
DOI URL |
[6] |
A. Misra, M. Verdier, Y. Lu, H. Kung, T. Mitchell, M. Nastasi, J. Embury, Scripta Mater. 39 1998 555-560.
DOI URL |
[7] | B. Clemens, H. Kung, S. Barnett, MRS Bull. 24 1999 20-26. |
[8] |
S. Izadi, H. Mraied, W. Cai, Surf. Coat. Technol. 275 2015 374-383.
DOI URL |
[9] |
D. Bufford, Z. Bi, Q. Jia, H. Wang, X. Zhang, Appl. Phys. Lett. 101 2012, 223112.
DOI URL |
[10] |
M. Nasim, Y. Li, M. Wen, C. Wen, Materialia 6 (2019), 100263.
DOI URL |
[11] |
M. Nasim, Y. Li, C. Wen, Materialia 6 (2019), 100347.
DOI URL |
[12] |
J. Zhang, X. Zhang, R. Wang, S. Lei, P. Zhang, J. Niu, G. Liu, G. Zhang, J. Sun, Acta Mater. 59 2011 7368-7379.
DOI URL |
[13] |
J. Zhang, G. Liu, J. Sun, Acta Mater. 66 2014 22-31.
DOI URL |
[14] |
N. Mara, D. Bhattacharyya, P. Dickerson, R. Hoagland, A. Misra, Appl. Phys. Lett. 92 2008, 231901.
DOI URL |
[15] |
A. Misra, X. Zhang, D. Hammon, R. Hoagland, Acta Mater. 53 2005 221-226.
DOI URL |
[16] | N.A. Mara, D. Bhattacharyya, P.O. Dickerson, R. Hoagland, A. Misra, Mater. Sci. Forum Trans Tech Publ (2010) 647-653. |
[17] |
D.R. Singh, N. Chawla, J. Mater. Res. 27 2012 278-283.
DOI URL |
[18] |
W. Han, A. Misra, N. Mara, T. Germann, J. Baldwin, T. Shimada, S. Luo, Philos. Mag. 91 2011 4172-4185.
DOI URL |
[19] |
W. Han, E. Cerreta, N. Mara, I. Beyerlein, J. Carpenter, S. Zheng, C. Trujillo, P. Dickerson, A. Misra, Acta Mater. 63 2014 150-161.
DOI URL |
[20] |
M. Demkowicz, R. Hoagland, J. Hirth, Phys. Rev. Lett. 100 2008, 136102.
DOI URL PMID |
[21] |
W. Han, M.J. Demkowicz, N.A. Mara, E. Fu, S. Sinha, A.D. Rollett, Y. Wang, J.S. Carpenter, I.J. Beyerlein, A. Misra, Adv. Mater. 25 2013 6975-6979.
DOI URL PMID |
[22] |
K. Hattar, M. Demkowicz, A. Misra, I. Robertson, R. Hoagland, Scripta Mater. 58 2008 541-544.
DOI URL |
[23] | N. Li, M. Nastasi, A. Misra, Int. J. Plasticity 32 (2012) 1-16. |
[24] | W. Li, B. Kabius, O. Auciello, Engineering in Medicine and Biology Society (EMBC), Annual International Conference of the IEEE, IEEE 2010 6237-6242. |
[25] |
J. Azadmanjiri, C.C. Berndt, J. Wang, A. Kapoor, V.K. Srivastava, C. Wen, J. Mater. Chem. A 2 (2014) 3695-3708.
DOI URL |
[26] | G.S. Hickey, S.-S. Lih, T.W. Barbee Jr, Astronomical Telescopes and Instrumentation, International Society for Optics and Photonics (2002) 63-76. |
[27] |
Q. Zhou, J. Xie, F. Wang, P. Huang, K. Xu, T. Lu, Acta Mech. Sin. 31 2015 319-337.
DOI URL |
[28] |
A. Misra, J. Hirth, R. Hoagland, Acta Mater. 53 2005 4817-4824.
DOI URL |
[29] |
E. Fu, N. Li, A. Misra, R. Hoagland, H. Wang, X. Zhang, Mater. Sci. Eng. A 493 (2008) 283-287.
DOI URL |
[30] |
J. Zhang, J. Niu, X. Zhang, P. Zhang, G. Liu, G. Zhang, J. Sun, Mater. Sci. Eng. A 543 (2012) 139-144.
DOI URL |
[31] |
C. Gu, F. Wang, P. Huang, T. Lu, K. Xu, Mater. Sci. Eng. A 649 (2016) 9-17.
DOI URL |
[32] |
Y. Wang, J. Li, A.V. Hamza, T.W. Barbee, Proc. Natl. Acad. Sci. 104 2007 11155-11160.
DOI URL PMID |
[33] |
J. Zhang, P. Zhang, X. Zhang, R. Wang, G. Liu, G. Zhang, J. Sun, Mater. Sci. Eng. A 545 (2012) 118-122.
DOI URL |
[34] |
W.R. Grove, Philos. Mag. 4 1852 498-514.
DOI URL |
[35] |
M. Panjan, T. Peterman, M. Čekada, P. Panjan, Surf. Coat. Technol. 204 2009 850-853.
DOI URL |
[36] |
C.H. Heo, S.-B. Lee, J.-H. Boo, Thin Solid Films 475 (2005) 183-188.
DOI URL |
[37] |
Y. Cui, P. Huang, F. Wang, T. Lu, K. Xu, Thin Solid Films 584 (2015) 270-276.
DOI URL |
[38] |
Y. Lu, R. Kotoka, J. Ligda, B. Cao, S. Yarmolenko, B. Schuster, Q. Wei, Acta Mater. 63 2014 216-231.
DOI URL |
[39] |
T. Wan, H. Aoki, J. Hikawa, J.H. Lee, Biomed. Mater. Eng. 17 2007 291-297.
URL PMID |
[40] |
M. Knez, K. Nielsch, L. Niinistö, Adv. Mater. 19 2007 3425-3438.
DOI URL |
[41] |
K. Kukli, J. Ihanus, M. Ritala, M. Leskela, Appl. Phys. Lett. 68 1996 3737-3739.
DOI URL |
[42] |
R.W. Johnson, A. Hultqvist, S.F. Bent, Mater. Today 17 (2014) 236-246.
DOI URL |
[43] |
Z. Sechrist, F. Fabreguette, O. Heintz, T. Phung, D. Johnson, S. George, Chem. Mater. 17 2005 3475-3485.
DOI URL |
[44] |
J. Elam, Z. Sechrist, S. George, Thin Solid Films 414 (2002) 43-55.
DOI URL |
[45] |
C. Ross, Annu. Rev. Mater. Sci. 24 1994 159-188.
DOI URL |
[46] | W. Blum, Trans. Am. Electrochem. Soc. 40 1921 307-320. |
[47] | A. Brenner, Electrodeposition of Alloys: Principles and Practice, Elsevier, 2013. |
[48] | J.R. Roos, J.P. Celis, M. De Bonte, Electrodeposition of metals and alloys, in: R.W. Cahn (Ed.), Materials Science and Technology, 15, VCH, Weinheim, 1991, pp. 481-537. |
[49] |
I. Bakonyi, L. Péter, Prog. Mater. Sci. 55 2010 107-245.
DOI URL |
[50] |
L. Piraux, J. George, J. Despres, C. Leroy, E. Ferain, R. Legras, K. Ounadjela, A. Fert, Appl. Phys. Lett. 65 1994 2484-2486.
DOI URL |
[51] |
K. Liu, K. Nagodawithana, P. Searson, C. Chien, Phys. Rev. B 51 (1995) 7381.
DOI URL |
[52] |
M. Dariel, L. Bennett, D. Lashmore, P. Lubitz, M. Rubinstein, W. Lechter, M. Harford, J. Appl. Phys. 61 1987 4067-4069.
DOI URL |
[53] |
T. Miyake, M. Kume, K. Yamaguchi, D.P. Amalnerkar, H. Minoura, Thin Solid Films 397 (2001) 83-89.
DOI URL |
[54] |
A. Haseeb, J.-P. Celis, J. Roos, J. Electrochem. Soc. 141 1994 230-237.
DOI URL |
[55] | N. Myung, B. Yoo, M. Schwartz, K. Nobe, Electrochem. Soc. Interface 2000 (2001) 154. |
[56] | Y. Hu, W.M. Cao, R.H. Yin, W.Q. Yu, S.H. Zeng, H.J. Wang, Open J. Funct. Mater. Res. 2 2005 7. |
[57] | A.C. Jones, M.L. Hitchman, in: Anthony C. Jones, Michael L. Hitchman (Eds.), Chemical Vapour Deposition: Precursors, Processes and Applications, 2009, pp. 1-36. |
[58] |
C. Bjormander, Surf. Coat. Technol. 201 2006 4032-4036.
DOI URL |
[59] |
C. Ziebert, S. Ulrich, J. Vac. Sci. Technol. A 24 (2006) 554-583.
DOI URL |
[60] |
Y. Su, W. Kao, J. Mater. Eng. Perform. 7 1998 601-612.
DOI URL |
[61] |
C. Subramanian, K.N. Strafford, Wear 165 (1993) 85-95.
DOI URL |
[62] |
Y. Saito, H. Utsunomiya, N. Tsuji, T. Sakai, Acta Mater. 47 1999 579-583.
DOI URL |
[63] |
D. Yang, P. Cizek, P. Hodgson, C. Wen, Scripta Mater. 62 2010 321-324.
DOI URL |
[64] |
K. Wu, H. Chang, E. Maawad, W. Gan, H. Brokmeier, M. Zheng, Mater. Sci. Eng. A 527 (2010) 3073-3078.
DOI URL |
[65] |
L. Ghalandari, M. Moshksar, J. Alloys Compd. 506 2010 172-178.
DOI URL |
[66] |
M. Eizadjou, A.K. Talachi, H.D. Manesh, H.S. Shahabi, K. Janghorban, Compos. Sci. Technol. 68 2008 2003-2009.
DOI URL |
[67] |
J. Carpenter, S. Vogel, J. LeDonne, D. Hammon, I. Beyerlein, N. Mara, Acta Mater. 60 2012 1576-1586.
DOI URL |
[68] |
M. Tayyebi, B. Eghbali, Mater. Sci. Eng. A 559 (2013) 759-764.
DOI URL |
[69] |
S. Wen, F. Zeng, F. Pan, Z. Nie, Mater. Sci. Eng. A 526 (2009) 166-170.
DOI URL |
[70] |
S. Wen, F. Zeng, Y. Gao, F. Pan, Scripta Mater. 55 2006 187-190.
DOI URL |
[71] |
S. Wen, R. Zong, F. Zeng, Y. Gao, F. Pan, J. Mater. Res. 22 2007 3423-3431.
DOI URL |
[72] |
S. Wen, R. Zong, F. Zeng, S. Guo, F. Pan, Appl. Surf. Sci. 255 2009 4558-4562.
DOI URL |
[73] |
S. Wen, R. Zong, F. Zeng, Y. Gao, F. Pan, Acta Mater. 55 2007 345-351.
DOI URL |
[74] |
X. Zhu, X. Liu, R. Zong, F. Zeng, F. Pan, Mater. Sci. Eng. A 527 (2010) 1243-1248.
DOI URL |
[75] |
X. Zhu, J. Luo, F. Zeng, F. Pan, Thin Solid Films 520 (2011) 818-823.
DOI URL |
[76] | F. Wang, L. Zhang, P. Huang, J. Xie, T. Lu, K. Xu, J. Nanomater. 2013 (2013) 55. |
[77] |
S. Wen, R. Zong, F. Zeng, Y. Gu, Y. Gao, F. Pan, Surf. Coat. Technol. 202 2008 2040-2046.
DOI URL |
[78] |
X. Zhu, J. Luo, G. Chen, F. Zeng, F. Pan, J. Alloys Compd. 506 2010 434-440.
DOI URL |
[79] |
Y. Liu, Y. Chen, K. Yu, H. Wang, J. Chen, X. Zhang, Int. J. Plasticity 49 (2013) 152-163.
DOI URL |
[80] |
E. Bauer, J.H. van der Merwe, Phys. Rev. B 33 (1986) 3657.
DOI URL |
[81] |
A. Donohue, F. Spaepen, R. Hoagland, A. Misra, Appl. Phys. Lett. 91 2007, 241905.
DOI URL |
[82] |
H. Chou, X. Du, C. Lee, J. Huang, Intermetallics 19 (2011) 1047-1051.
DOI URL |
[83] |
J. Zhang, G. Liu, S. Lei, J. Niu, J. Sun, Acta Mater. 60 2012 7183-7196.
DOI URL |
[84] | R. Hoagland, T. Mitchell, J. Hirth, H. Kung, Philos. Mag. 82 2002 643-664. |
[85] |
A.K. Mukherjee, Mater. Sci. Eng. A 322 (2002) 1-22.
DOI URL |
[86] |
Y.-C. Wang, A. Misra, R. Hoagland, Scripta Mater. 54 2006 1593-1598.
DOI URL |
[87] |
Y. Liu, D. Bufford, H. Wang, C. Sun, X. Zhang, Acta Mater. 59 2011 1924-1933.
DOI URL |
[88] |
I. Beyerlein, N. Mara, J. Wang, J. Carpenter, S. Zheng, W. Han, R. Zhang, K. Kang, T. Nizolek, T. Pollock, JOM 64 (2012) 1192-1207.
DOI URL |
[89] |
K. Kang, J. Wang, I. Beyerlein, J. Appl. Phys. 111 2012, 053531.
DOI URL |
[90] |
J. Wang, R.G. Hoagland, A. Misra, Scripta Mater. 60 2009 1067-1072.
DOI URL |
[91] |
J. Wang, R. Hoagland, J. Hirth, A. Misra, Acta Mater. 56 2008 5685-5693.
DOI URL |
[92] |
J. Wang, R. Hoagland, J. Hirth, A. Misra, Acta Mater. 56 2008 3109-3119.
DOI URL |
[93] |
R. Zhang, J. Wang, I. Beyerlein, A. Misra, T. Germann, Acta Mater. 60 2012 2855-2865.
DOI URL |
[94] |
X. An, S. Zhu, Y. Cao, M. Kawasaki, X. Liao, S. Ringer, J. Nie, T. Langdon, Y. Zhu, Appl. Phys. Lett. 107 2015, 011901.
DOI URL |
[95] |
Y. Shen, L. Lu, M. Dao, S. Suresh, Scripta Mater. 55 2006 319-322.
DOI URL |
[96] |
J. Koehler, Phys. Rev. B 2 (1970) 547.
DOI URL |
[97] |
B. Chirranjeevi, T. Abinandanan, M. Gururajan, Acta Mater. 57 2009 1060-1067.
DOI URL |
[98] |
B.C. Kang, H.Y. Kim, O.Y. Kwon, S.H. Hong, Scripta Mater. 57 2007 703-706.
DOI URL |
[99] |
J. McKeown, A. Misra, H. Kung, R. Hoagland, M. Nastasi, Scripta Mater. 46 2002 593-598.
DOI URL |
[100] |
D. Bhattacharyya, N. Mara, P. Dickerson, R. Hoagland, A. Misra, J. Mater. Res. 24 2009 1291-1302.
DOI URL |
[101] |
P.M. Anderson, J.F. Bingert, A. Misra, J.P. Hirth, Acta Mater. 51 2003 6059-6075.
DOI URL |
[102] |
A. Lima, X. Zhang, A. Misra, C. Booth, E. Bauer, M. Hundley, Thin Solid Films 515 (2007) 3574-3579.
DOI URL |
[103] | A. Misra, M. Demkowicz, J. Wang, R. Hoagland, JOM (1989) 60 2008 39-42. |
[104] |
J. Carpenter, A. Misra, M. Uchic, P. Anderson, Appl. Phys. Lett. 101 2012, 051901.
DOI URL |
[105] |
Y. Kim, A.S. Budiman, J.K. Baldwin, N.A. Mara, A. Misra, S.M. Han, J. Mater. Res. 27 2012 592-598.
DOI URL |
[106] |
J. Zhang, S. Lei, Y. Liu, J. Niu, Y. Chen, G. Liu, X. Zhang, J. Sun, Acta Mater. 60 2012 1610-1622.
DOI URL |
[107] |
B. Ham, X. Zhang, Mater. Sci. Eng. A 528 (2011) 2028-2033.
DOI URL |
[108] | T. Britton, H. Liang, F. Dunne, A. Wilkinson, Proc. R. Soc. Lond. A: Math. Phys. Eng. Sci. R. Soc. (2010) 695-719. |
[109] | R.W.K. Honeycombe, The Plastic Deformation of Metals, 2nd ed., Edward Arnold, London 1984. |
[110] | E. Ghali, Uhlig’s Corrosion Handbook, third edition, 2000, pp. 809-836. |
[111] |
J. Koike, T. Kobayashi, T. Mukai, H. Watanabe, M. Suzuki, K. Maruyama, K. Higashi, Acta Mater. 51 2003 2055-2065.
DOI URL |
[112] |
S.R. Agnew, Ö. Duygulu, Int. J. Plasticity 21 (2005) 1161-1193.
DOI URL |
[113] |
Y. Wang, A. Hamza, T. Barbee Jr, Appl. Phys. Lett. 91 2007, 061924.
DOI URL |
[114] |
M. Liu, J. Huang, Y. Fong, S. Ju, X. Du, H. Pei, T. Nieh, Acta Mater. 61 2013 3304-3313.
DOI URL |
[115] | J. Zhang, G. Liu, J. Sun, Sci. Rep. 3 (1) (2013) 1-6. |
[116] |
C. Gu, F. Wang, P. Huang, K. Xu, T. Lu, Mater. Sci. Eng. A 658 (2016) 381-388.
DOI URL |
[117] |
M. Mata, M. Anglada, J. Alcalá, J. Mater. Res. 17 2002 964-976.
DOI URL |
[118] |
A. Misra, H. Krug, Adv. Eng. Mater. 3 2001 217-222.
DOI URL |
[119] |
G. Was, T. Foecke, Thin Solid Films 286 (1996) 1-31.
DOI URL |
[120] |
P. Anderson, C. Li, Nanostruct. Mater. 5 1995 349-362.
DOI URL |
[121] |
J. Embury, J. Hirth, Acta Metall. Mater. 42 1994 2051-2056.
DOI URL |
[122] |
M. Phillips, B. Clemens, W. Nix, Acta Mater. 51 2003 3157-3170.
DOI URL |
[123] |
S.I. Rao, P.M. Hazzledine, Philos. Mag. 80 2000 2011-2040.
DOI URL |
[124] |
P. Anderson, C. Li, Materials 5 (1995) 349.
DOI URL PMID |
[125] |
M. Liu, J. Huang, H. Chou, Y. Lai, C. Lee, T. Nieh, Scripta Mater. 61 2009 840-843.
DOI URL |
[126] |
J.Y. Kim, D. Jang, J.R. Greer, Adv. Funct. Mater. 21 2011 4550-4554.
DOI URL |
[127] |
T. Nieh, J. Wadsworth, Scripta Mater. 44 2001 1825-1830.
DOI URL |
[128] |
Y. Li, X. Zhu, G. Zhang, J. Tan, W. Wang, B. Wu, Philos. Mag. 90 2010 3049-3067.
DOI URL |
[129] |
K. Hu, L. Xu, Y. Cao, G. Pan, Z. Cao, X. Meng, Mater. Lett. 107 2013 303-306.
DOI URL |
[130] |
J. Zhang, Y. Liu, J. Chen, Y. Chen, G. Liu, X. Zhang, J. Sun, Mater. Sci. Eng. A 552 (2012) 392-398.
DOI URL |
[131] |
P. Huang, F. Wang, M. Xu, T. Lu, K. Xu, Mater. Sci. Eng. A 528 (2011) 5908-5913.
DOI URL |
[132] |
E. Frutos, M. Callisti, M. Karlik, T. Polcar, Mater. Sci. Eng. A 632 (2015) 137-146.
DOI URL |
[133] |
W. Lai, M. Yang, Appl. Phys. Lett. 90 2007, 181917.
DOI URL |
[134] |
S. Wen, F. Zeng, Y. Gao, F. Pan, Surf. Coat. Technol. 201 2006 1262-1266.
DOI URL |
[135] |
S. Wen, R. Zong, F. Zeng, Y. Gao, F. Pan, Mater. Sci. Eng. A 457 (2007) 38-43.
DOI URL |
[136] | A. Jankowski, T. Tsakalakos, J. Phy. F Met. Phys. 15 1985 1279. |
[137] |
F. Streitz, R. Cammarata, K. Sieradzki, Phys. Rev. B 49 (1994) 10707.
DOI URL |
[138] |
N. Mara, D. Bhattacharyya, R. Hoagland, A. Misra, Scripta Mater. 58 2008 874-877.
DOI URL |
[139] |
H. Huang, F. Spaepen, Acta Mater. 48 2000 3261-3269.
DOI URL |
[140] |
M.N. Polyakov, J. Lohmiller, P.A. Gruber, A.M. Hodge, Adv. Eng. Mater. 17 2015 810-814.
DOI URL |
[141] |
N. Mara, D. Bhattacharyya, J. Hirth, P. Dickerson, A. Misra, Appl. Phys. Lett. 97 2010, 021909.
DOI URL |
[142] | S. Lotfian, M. Rodríguez, K. Yazzie, N. Chawla, J. Llorca J.M. Molina-Aldareguía, Molina-Aldareguía, Acta Mater. 61 2013 4439-4451. |
[143] |
A. Misra, H. Kung, D. Hammon, R. Hoagland, M. Nastasi, Int. J. Damage Mech. 12 2003 365-376.
DOI URL |
[144] |
D.A. Chance, D.L. Wilcox, Proc. IEEE 59 (1971) 1455-1462.
DOI URL |
[145] |
C. Nunes, V. Teixeira, M. Prates, N. Barradas, A. Sequeira, Thin Solid Films 442 (2003) 173-178.
DOI URL |
[146] | Q.-C. Zhang, J.Phys. D Appl. Phys. 34 2001 3113. |
[147] |
S. Zhao, E. Wäckelgård, Sol. Energy Mater. Sol. Cells 90 (2006) 243-261.
DOI URL |
[148] |
H. Wan, Y. Shen, J. Wang, Z. Shen, X. Jin, Acta Mater. 60 2012 6869-6881.
DOI URL |
[149] | K. Ma, A. Bloyce, Bell, Surf. Coat. Technol. 76 1995 297-302. |
[150] |
S. Lotfian, J.M. Molina-Aldareguia, K. Yazzie, J. Llorca, N. Chawla, Philos. Mag. Lett. 92 2012 362-367.
DOI URL |
[151] |
S. Lotfian, C. Mayer, N. Chawla, J. Llorca, A. Misra, J. Baldwin, J.M. Molina-Aldareguía, Thin Solid Films 571 (2014) 260-267.
DOI URL |
[152] |
L.W. Yang, C. Mayer, N. Li, J. Baldwin, N.A. Mara, N. Chawla, J.M. Molina-Aldareguia, J. Llorca, Acta Mater. 142 2018 37-48.
DOI URL |
[153] |
K.J. Hsia, Z. Suo, W. Yang, J. Mech, Phys. Solids 42 (1994) 877-896.
DOI URL |
[154] |
G. Odette, B. Chao, J. Sheckherd, G. Lucas, Acta Metall. Mater. 40 1992 2381-2389.
DOI URL |
[155] | R.W. Hertzberg, Deformation and Fracture Mechanics of Engineering Materials, 3rd ed., John Wiley, New York, 1989. |
[156] |
J. Zhang, X. Zhang, G. Liu, G. Zhang, J. Sun, Mater. Sci. and Eng. A 528 (2011) 2982-2987.
DOI URL |
[157] |
L.H. Friedman, D. Chrzan, Phys. Rev. Lett. 81 1998 2715.
DOI URL |
[158] |
R. Cammarata, T. Schlesinger, C. Kim, S. Qadri, A. Edelstein, Appl. Phys. Lett. 56 1990 1862-1864.
DOI URL |
[159] | J. Li, C.A. Cook, AIME, 1963 197. |
[160] |
H.-H. Fu, D.J. Benson, M.A. Meyers, Acta Mater. 49 2001 2567-2582.
DOI URL |
[161] | M. Marcinkowski, R. Armstrong, J. Appl, Phys. 43 1972 2548-2554. |
[162] |
H. Liu, Q. Gao, Theor. Appl. Fract. Mec. 12 1990 195-204.
DOI URL |
[163] |
R. Armstrong, Y. Chou, R. Fisher, N. Louat, Philos. Mag. 14 1966 943-951.
DOI URL |
[164] |
J.C. Li, G.C. Liu, Philos. Mag. 15 1967 1059-1063.
DOI URL |
[165] |
J. Niu, J. Zhang, G. Liu, P. Zhang, S. Lei, G. Zhang, J. Sun, Acta Mater. 60 2012 3677-3689.
DOI URL |
[166] | P. Anderson, T. Foecke, P. Hazzledine, MRS Bull. 24 1999 27-33. |
[167] | J. Wang, A. Misra, Curr. Opin. Solid State Mater.Sci. 18 2014 19-28. |
[168] |
A. Misra, J. Hirth, H. Kung, Philos. Mag. A 82 (2002) 2935-2951.
DOI URL |
[169] |
A. Misra, J. Hirth, R. Hoagland, J. Embury, H. Kung, Acta Mater. 52 2004 2387-2394.
DOI URL |
[170] | K.-N. Tu, J.W. Mayer, L.C. Feldman, Electronic Thin Film Science, Macmillan, New York, 1992. |
[171] |
Q. Wei, A. Misra, Acta Mater. 58 2010 4871-4882.
DOI URL |
[172] |
A. Misra, M. Verdier, H. Kung, J. Embury, J. Hirth, Scripta Mater. 41 1999 973-979.
DOI URL |
[173] |
I.N. Mastorakos, H.M. Zbib, D.F. Bahr, Appl. Phys. Lett. 94 2009, 173114.
DOI URL |
[174] |
S. Kamat, J. Hirth, J. Appl. Phys. 67 1990 6844-6850.
DOI URL |
[175] | J. Yan, X. Zhu, G. Zhang, C. Yan, Thin Solid Films 527 (2013) 227-231. |
[176] | S. Lehoczky, J. Appl. Phys. 49 1978 5479-5485. |
[177] | J. Xu, M. Kamiko, H. Sawada, Y. Zhou, R. Yamamoto, L. Yu, I. Kojima, J. Vac. Sci. Technol. B: Microelectron. Nanometer. Struct. Process. Meas. Phenomena 21 (2003) 2584-2589. |
[178] | C. Thompson, Annu. Rev. Mater. Sci. 30 2000 159-190. |
[179] | C. Kim, S. Qadri, M. Scanlon, R. Cammarata, Thin Solid Films 240 (1994) 52-55. |
[180] | L.B. Freund, S. Suresh, Thin Film Materials: Stress, Defect Formation and Surface Evolution, Cambridge University Press, 2004. |
[181] | A.H. Cottrell, Prog. Met. Phys. 4 (1953), 205IN5209IN7249-208248264. |
[182] | J. Wang, R.G. Hoagland, A. Misra, J. Mater. Res. 23 2008 1009-1014. |
[183] | R.G. Hoagland, R.J. Kurtz, C.H. Henager, Scripta Mater. 50 2004 775-779. |
[184] | R. Zhang, J. Wang, I. Beyerlein, T. Germann, Scripta Mater. 65 2011 1022-1025. |
[185] | G. Zhang, Y. Liu, W. Wang, J. Tan, Appl. Phys. Lett. 88 2006, 013105. |
[186] | H. Song, J. Xu, Y. Zhang, S. Li, D. Wang, Y. Li, Mater. Design 127 (2017) 173-182. |
[187] | B. Cheng, J.R. Trelewicz, Acta Mater. 117 2016 293-305. |
[188] | Y. Li, J. Tan, G. Zhang, Scripta Mater. 59 2008 1226-1229. |
[189] | J. Xie, P. Huang, F. Wang, Y. Li, K. Xu, Surf. Coat. Technol. 228 2013 S593-S596. |
[190] | Y. Li, X. Zhu, J. Tan, B. Wu, G. Zhang, Philos. Mag. Lett. 89 2009 66-74. |
[191] | A. Lewis, D. Josell, T.P. Weihs, Scripta Mater. 48 2003 1079-1085. |
[192] | A. Misra, R. Hoagland, J. Mater. Res. 20 2005 2046-2054. |
[193] | A. Misra, R. Hoagland, H. Kung, Philos. Mag. 84 2004 1021-1028. |
[194] | C. Zhang, K. Feng, Z. Li, F. Lu, J. Huang, Y. Wu, P.K. Chu, Acta Mater. 133 2017 55-67. |
[195] | D. Josell, F. Spaepen, MRS Bull. 24 1999 39-43. |
[196] | A.J. Detor, C.A. Schuh, Acta Mater. 55 2007 4221-4232. |
[197] | U. Welzel, J. Kümmel, E. Bischoff, S. Kurz, E.J. Mittemeijer, J. Mater. Res. 26 2011 2558-2573. |
[198] | G. Csiszár, S. Kurz, E.J. Mittemeijer, Acta Mater. 110 2016 324-340. |
[199] | S. Bajt, J. Almeda, T. Naree, M. Clift, A. Folta, B. Kauffman, E. Spiller, Improved reflectance and stability of Mo/Si multilayers, Opt. Eng. 41 (8) (2002) 1797-1804. |
[200] | J.A. Folta, S. Bajt, T.W. Barbee, R.F. Grabner, P.B. Mirkarimi, T.D. Nguyen, M.A. Schmidt, E.A. Spiller, C.C. Walton, M. Wedowski, Emerging Lithographic Technologies III, International Society for Optics and Photonics (1999) 702-710. |
[201] | R. Stuik, E. Louis, A. Yakshin, P. Görts, E. Maas, F. Bijkerk, D. Schmitz, F. Scholze, G. Ulm, M. Haidl, J. Vac. Sci. Technol. B Microelectron. Nanometer Struct.Process. Meas. Phenom. 17 1999 2998-3002. |
[202] | Q. Wei, Y. Wang, M. Nastasi, A. Misra, Philos. Mag. Abingdon (Abingdon) 91 2011 553-573. |
[203] | M. Callisti, M. Karlik, T. Polcar, J. Nucl. Phys. Mater. Sci. Radiat. Appl. 473 2016 18-27. |
[204] | L. Yang, S. Zheng, Y. Zhou, J. Zhang, Y. Wang, C. Jiang, N. Mara, I. Beyerlein, X. Ma, J. Nucl, Mater. 487 2017 311-316. |
[205] | W. Han, N. Mara, Y. Wang, A. Misra, M. Demkowicz, J. Nucl. Phys. Mater. Sci. Radiat. Appl. 452 2014 57-60. |
[206] | J. Hunn, E. Lee, T. Byun, L. Mansur, J. Nucl. Phys. Mater. Sci. Radiat. Appl. 282 2000 131-136. |
[207] | M. Makin, F. Minter, Acta Metall. 8 1960 691-699. |
[208] | X. Zhang, N. Li, O. Anderoglu, H. Wang, J. Swadener, T. Höchbauer, A. Misra, R. Hoagland, Nucl. Instrum. Methods Phys. Res. B 261 (2007) 1129-1132. |
[209] | E. Fu, J. Carter, G. Swadener, A. Misra, L. Shao, H. Wang, X. Zhang, J. Nucl, Mater. 385 2009 629-632. |
[210] | E. Fu, A. Misra, H. Wang, L. Shao, X. Zhang, J. Nucl. Phys. Mater. Sci. Radiat. Appl. 407 2010 178-188. |
[211] | N. Li, E. Fu, H. Wang, J. Carter, L. Shao, S. Maloy, A. Misra, X. Zhang, J. Nucl, Mater. 389 2009 233-238. |
[212] | Q. Wei, N. Li, N. Mara, M. Nastasi, A. Misra, Acta Mater. 59 2011 6331-6340. |
[213] | G. Chawa, G. Wilcox, D. Gabe, Trans. Inst. Met. Finish. 76 1998 117-120. |
[214] | I. Ivanov, T. Valkova, I. Kirilova, J. Appl. Electrochem. 32 2002 85-89. |
[215] | I. Ivanov, I. Kirilova, J. Appl. Electrochem. 33 2003 239-244. |
[216] | S. Yogesha, R.S. Bhat, K. Venkatakrishna, G. Pavithra, Y. Ullal, A.C. Hegde, Synthesis and Reactivity in Inorganic, Metal-Organic, and Nano-Metal Chemistry, 41, 2011, pp. 65-71. |
[217] | S. Yogesha, A.C. Hegde, J. Mater. Process. Tech. 211 2011 1409-1415. |
[218] | B.E. Conway, Electrochemical Supercapacitors: Scientific Fundamentals and Technological Applications, Springer Science & Business Media, 2013. |
[219] |
J.-y. Fei, G. Wilcox, Surf. Coat. Technol. 200 2006 3533-3539.
DOI URL |
[220] |
N.M. Heckman, L. Velasco, A.M. Hodge, Adv. Eng. Mater. 18 2016 918-922.
DOI URL |
[221] | I. Ovid’ko, A. Sheinerman, Rev. Adv. Mater. Sci. 44 (1) (2016) 1-25. |
[222] |
L. Velasco, M.N. Polyakov, A.M. Hodge, Scripta Mater. 83 2014 33-36.
DOI URL |
[223] |
X. An, S. Wu, Z. Wang, Z. Zhang, Acta Mater. 74 2014 200-214.
DOI URL |
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[2] | Hui Jiang, Dongxu Qiao, Wenna Jiao, Kaiming Han, Yiping Lu, Peter K. Liaw. Tensile deformation behavior and mechanical properties of a bulk cast Al0.9CoFeNi2 eutectic high-entropy alloy [J]. J. Mater. Sci. Technol., 2021, 61(0): 119-124. |
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