J. Mater. Sci. Technol. ›› 2018, Vol. 34 ›› Issue (2): 398-402.DOI: 10.1016/j.jmst.2016.09.027

• Orginal Article • Previous Articles     Next Articles

Microstructure and secondary phases in epitaxial LaBaCo2O5.5 + δ thin films

Jiangbo Lua(), Lu Lua, Sheng Chenga, Ming Liua, Chunlin Jiaab   

  1. aSchool of Electronic and Information Engineering & State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, China;
    bErnst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 52425, Jülich, Germany;
  • Received:2016-09-08 Revised:2016-09-25 Accepted:2016-09-28 Online:2018-02-10 Published:2018-02-10

Abstract:

Aberration-corrected scanning transmission electron microscopy was employed to investigate the microstructures and secondary phases in LaBaCo2O5.5 + δ (LBCO) thin films grown on SrTiO3 (STO) substrates. The as-grown films showed an epitaxial growth on the substrates with atomically sharp interfaces and orientation relationships of [100]LBCO//[100]STO and (001)LBCO//(001)STO. Secondary phases were observed in the films, which strongly depended on the sample fabrication conditions. In the film prepared at a temperature of 900 °C, nano-scale CoO pillars nucleated on the substrate, and grew along the [001] direction of the film. In the film grown at a temperature of 1000 °C, isolated nano-scale Co3O4 particles appeared, which promoted the growth of {111} twinning structures in the film. The orientation relationships and the interfaces between the secondary phases and the films were illustrated, and the growth mechanism of the film was discussed.

Key words: Nano-structure, Faceted interfaces, Secondary phase growth, Epitaxial thin film, Microstructure, Aberration-corrected scanning transmission electron microscopy