Fig. 1. Room temperature microstructure of Ti60 billet in longitudinal section after heat treatment at 1035 °C.

Fig. 2. {0001} and {11$\bar{2}$0} pole figures of Ti60 billet measured by XRD.

Fig. 3. IPF map of annealed sample.

Fig. 4. IPF orientation maps and corresponding pole figures of α phase for sample after annealing at 1030 °C: (a) complete α phase; (b) αp grains in (a); (c) αs grains in (a).

Fig. 5. Local texture of (a) αp and (b) αs in boxed zones in Fig. 4(b) and (c), respectively.

Fig. 6. (a) IPF orientation map and (b) corresponding pole figures of reconstructed β of sample after annealing at 1035 °C. It is noted that the low (≤15°) and high (>15°) deviation angle, θ, from BOR between αp, which is represented by the band contrast map, and the surrounding β phase is depicted by white and black lines, respectively.

Fig. 7. Distribution of deviation angle from BOR between αp and surrounding β phase in sample annealed at 1035 °C and theoretical result of random distribution between α and β phases.

Fig. 8. (a) Regions in EBSD map corresponding to texture component A as well as their corresponding stereographic projection and (b) misorientation along red arrow in (a).