Simultaneous enhancement of strength and ductility of body-centered cubic TiZrNb multi-principal element alloys via boron-doping

doi:10.1016/j.jmst.2020.10.043

Abstract

Abstract:

Body-centered cubic (BCC) multi-principal element alloys (MPEAs) have intrinsic high strength but poor ductility, which greatly limits their potential applications. Here we present the boron-doping strategy to enhance the strength and ductility of TiZrNb MPEAs simultaneously. The yield strength and ductility of the TiZrNb MPEA with boron addition of 500 ppm are increased by 19.0 % and 48.7 % compared to the boron-free TiZrNb MPEA, respectively. Boron-doping induced high efficiency in grain refinement from ∼96.0 μm to ∼16.2 μm is the main factor for strengthening. Dislocation dominated deformation mechanism involving cross slip and dislocation pining in the TiZrNb containing 500 ppm boron serves to enhance the strain-hardening capacity, resultant the enhancement of ductility from 7.8 % to 11.6 %. While the planar slip of dislocations is the dominated deformation mechanism for the boron-free TiZrNb.

Key words: Boron-doping, TiZrNb, Grain refinement, Strain-hardening capacity, Deformation mechanism

Jingyu Pang, Hongwei Zhang, Long Zhang, Zhengwang Zhu, Huameng Fu, Hong Li, Aimin Wang, Zhengkun Li, Haifeng Zhang. Simultaneous enhancement of strength and ductility of body-centered cubic TiZrNb multi-principal element alloys via boron-doping[J]. J. Mater. Sci. Technol., 2021, 78: 74-80.

Figures/Tables 6

Fig. 1. XRD patterns (a) and grain size statistics (b) of undoped and boron-doped TiZrNb MEAs after annealing at 800 °C for 1 h.

Fig. 2. Typical EBSD grain maps and grain boundary maps of the annealed TiZrNb MPEAs: EBSD grain maps (a-d) and grain boundary maps (e-h) of B0, B50, B200 and B500 samples, respectively.

Fig. 3. Pole figures (PFs) of B0, B50, B200 and B500 samples subjected to annealing at 800 °C, respectively.

Fig. 4. Room-temperature tensile properties of B0, B50, B200 and B500 samples (a), strain-hardening rates of B200 and B500 samples (B0 and B50 have undergone strain-softening, hence there are no strain-hardening rates for them) (b).

Fig. 5. The necking areas of SEM characterization for B0, B50, B200 and B500 samples after failure. Continuous slip bands were marked by black arrows, short-range slip bands blocked by GBs were marked by red arrows.

Fig. 6. The two-beam condition BF-TEM images of dislocation structures of B0 (a) and B500 (b) after tensile test. The enlarged dislocation loop (c), dislocation dipole (d) and dislocation pinning (e) in B500.

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