Preparation and Characterization of Ca3Co4O9 Thin Films on Polycrystalline Al2O3 Substrates by Chemical Solution Deposition

doi:10.1016/j.jmst.2012.12.007

Abstract

Abstract:

Ca₃Co₄O₉thin films have been first prepared on polycrystalline Al₂O₃ substrates using chemical solution deposition method by multiple annealing processing. It is observed that the derived thin films are c-axis oriented although the substrates are polycrystalline Al₂O₃ substrates, suggesting the self-assembled c-axis orientation. The annealing temperature effects on the properties are investigated and discussed. The best performances are attributed to the 850 ^oC-annealed sample, whose resistivity, Seebeck coefficient and power factor at 300 K are 7.4 mΩ cm, 117 μV/K and 0.18 mW/m K^-2respectively, which is even better than those of the thin films deposited on single crystal substrates. The results will provide an effective route to optimize the properties of Ca₃Co₄O₉ thin films using chemical solution deposition by multiple annealing processing even the substrates are polycrystalline.

Key words: Chemical solution deposition, Thermoelectric, Cobaltate

Yankun Fu, Xianwu Tang, Jie Yang, Hongbin Jian, Xuebin Zhu, Yuping Sun1. Preparation and Characterization of Ca₃Co₄O₉Thin Films on Polycrystalline Al₂O₃Substrates by Chemical Solution Deposition[J]. J. Mater. Sci. Technol., 2013, 29(1): 13-16.

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Preparation and Characterization of Ca₃Co₄O₉Thin Films on Polycrystalline Al₂O₃Substrates by Chemical Solution Deposition

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