Fig. 1. (a) The inverse pole figure (IPF) and (b) phase maps, and (c) the ODF (φ2 = 0°, 45°, and 63° ODF sections) of the initial material.

Fig. 2. The IPF and grain boundary (GB) maps for the microstructure of the samples rolled with SR of (a) 1, (b) 2, (c) 3, and (d) 4.

Fig. 3. The IPF, kernel average misorientation (KAM), and GB maps for the microstructures of the samples rolled at SR of (a) 2 and (b) 4 with high magnification. The KAM and GB maps show the rectangular regions in the IPF maps.

Fig. 4. The orientation gradients marked along the lines (a) A, (b) B, (c) C, and (d) D in Fig. 3(a) and (b), and (e) A and (f) B in Fig. 13(b) and (d).

Fig. 5. (a) The average grain sizes, (b) the DRXed grain size, and (c) the fraction of DRXed grains and HAGBs.

Fig. 6. The grain size distribution in the samples rolled with different SRs. (a) As-rolled samples and (b) the rolled samples after annealing at 973 K for 1 h.

Fig. 7. (a) The XRD curves for the samples deformed with different SRs and (b) the magnified (111) peaks in (a). (c) The dislocation density calculated based on the XRD and EBSD data.

Fig. 8. The φ2 = 0°, 45°, and 63° ODF sections of the samples rolled with SRs of (a) 1, (b) 2, (c) 3, and (d) 4.

Fig. 9. The ODF intensities of individual texture components belonging to recrystallization, rolling, and shear texture at different SRs: (a) 1, (b) 2, (c) 3, and (d) 4.

Fig. 10. The ODF intensities of (a) α fiber, (b) β fiber, and (c) γ fiber for the as-rolled samples at different SRs.

Fig. 11. The rolling and shear texture components mapped in the EBSD microstructures of the samples rolled at SRs: (a) 1, (b) 2, and (c) 4.

Fig. 12. The spatial relationship between the overlapped rolling texture and shear texture components: the rotation between (a) copper texture and shear1 around [$10\bar{1}$], (b) copper texture and shear2 around [$1\bar{1}0$], (c) S texture and shear3 around [$7\bar{9}11$], and (d) brass and shear4 around [$\bar{1}11$].

Fig. 13. The IPF, KAM, and GB maps for the microstructures of the samples annealed at 873 K for 1 h with different SRs: (a) 1, (b) 2, (c) 3, and (d) 4. The KAM and GB maps show the rectangular regions in the IPF maps.

Fig. 14. The φ2=0°, 45°, and 63° ODF sections of the samples annealed at 873 K for 1 h with different SRs: (a) 1, (b) 2, (c) 3, and (d) 4. The φ2=0°, 45°, and 63° ODF sections of the samples annealed at 973 K for 1 h with different SRs: (e) 1, (f) 2, (g) 3, and (h) 4.

Fig. 15. The (111) pole figure for the recrystallized (RXed) grains and un-recrystallized (unRXed) grains in the sample rolled at SR = 4.

Fig. 16. The IPF and GB maps for the microstructures of the samples annealed at 973 K for 1 h with different SRs: (a) 1, (b) 2, (c) 3, and (d) 4.

Fig. 17. The plots for the ODF intensities of various texture components as a function of annealing temperature including the data for the initial and as-rolled samples at different SRs: (a) 1, (b) 2, (c) 3, and (d) 4. The plots of the ODF intensities of shear texture components as a function of SR for the samples prepared under different conditions: (e) as-rolled, (f) annealed at 873 K, and (g) annealed at 973 K.

Fig. 18. The sum of the area fractions for the grains with the texture components belonging to the (a) α, (b) β, and (c) γ fibers as a function of annealing temperature including the data for the initial and as-rolled samples.

Fig. 19. (a) The microhardness measurement results (along the sheet thickness direction) for the as-rolled samples at different SRs. (b) The engineering stress-engineering strain curves for the as-rolled and annealed samples at different SRs. (c) The plot of σy of the rolled and annealed materials as a function of d - 1/2. (d) The plot of strain hardening rates (and true stress) vs true strain for the rolled and annealed materials.

Fig. 20. (a) Comparison of the calculated yield stresses based on Eq. (3) with the experimental data of the as-rolled materials. (b) Comparison of the calculated yield stresses based on Eqs. (4) and (5) with the experimental data of the rolled materials annealed at 873 K.