J. Mater. Sci. Technol. ›› 2020, Vol. 40: 15-23.DOI: 10.1016/j.jmst.2019.08.040
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Wei Fua, Xiaoguo Songab*(), Ruichen Tianb, Yuzhen Leib, Weimin Longc, Sujuan Zhongc, Jicai Fengab
Received:
2019-07-10
Revised:
2019-08-09
Accepted:
2019-08-20
Published:
2020-03-01
Online:
2020-04-01
Contact:
Song Xiaoguo
Wei Fu, Xiaoguo Song, Ruichen Tian, Yuzhen Lei, Weimin Long, Sujuan Zhong, Jicai Feng. Wettability and joining of SiC by Sn-Ti: Microstructure and mechanical properties[J]. J. Mater. Sci. Technol., 2020, 40: 15-23.
Fig. 1. Variations of contact angles in temperature-rising tests, profiles of droplets captured by camera at 1000 °C and the optical images of solidified melts.
Condition | Sn-1Ti | Sn-2Ti | Sn-5Ti | Sn-8Ti |
---|---|---|---|---|
at 950 °C in temperature-rising tests | 25° | 27° | 27° | 28° |
Isothermal test at 1800 s | 46° | 26° | 27° | 25° |
Table 1 Contact angles at certain moment in temperature-rising and isothermal tests.
Condition | Sn-1Ti | Sn-2Ti | Sn-5Ti | Sn-8Ti |
---|---|---|---|---|
at 950 °C in temperature-rising tests | 25° | 27° | 27° | 28° |
Isothermal test at 1800 s | 46° | 26° | 27° | 25° |
Fig. 3. Typical interfacial microstructure of Sn-2Ti/SiC system after temperature-rising test: (a) low-magnification SEM image, (b) high-magnification SEM image, (c) top observation of reaction layer after etch off droplet, (d) XRD patterns of (c).
Spots | Sn | Ti | Si | C | Possible phases |
---|---|---|---|---|---|
A | 99.62 | 0.38 | 0 | 0 | β-Sn |
B | 46.94 | 53.06 | 0 | 0 | Ti6Sn5 |
C | 1.82 | 52.08 | 14.63 | 31.47 | TiCx + Ti-Si |
D | 10.45 | 40.35 | 25.46 | 23.74 | TiCx + Ti-Si |
Table 2 EDS results of the spots marked in Fig. 3 (at.%).
Spots | Sn | Ti | Si | C | Possible phases |
---|---|---|---|---|---|
A | 99.62 | 0.38 | 0 | 0 | β-Sn |
B | 46.94 | 53.06 | 0 | 0 | Ti6Sn5 |
C | 1.82 | 52.08 | 14.63 | 31.47 | TiCx + Ti-Si |
D | 10.45 | 40.35 | 25.46 | 23.74 | TiCx + Ti-Si |
Fig. 5. Interfacial structures of Sn-1Ti/SiC system (950 °C): cross sectional interface (a) and top view of reaction layers (b) after temperature-rising test, cross sectional interface (c) and top view of reaction layers (d) after isothermal test.
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