J. Mater. Sci. Technol.

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Type Inversion and Certain Physical Properties of Spray Pyrolysed SnO2:Al Films for Novel Transparent Electronics Applications

K. Ravichandran, K. Thirumurugan   

  1. Post Graduate and Research Department of Physics, AVVM Sri Pushpam College (Autonomous), Poondi, Thanjavur 613 503,Tamil Nadu, India
  • Received:2013-03-18 Revised:2013-05-22 Online:2014-02-15 Published:2014-02-14
  • Contact: K.Ravichandran
  • Supported by:

    Financial support from the University Grants Commission of India through the Major Research Project (F. No. 40-28/2011(SR)) is gratefully acknowledged.

Abstract:

Aluminium doped tin oxide films have been deposited onto glass substrates by using a simplified and low cost spray pyrolysis technique. The Al doping level varies between 0 and 30 at.% in the step of 5 at.%. The resistivity (ρ) is the minimum (0.38 Ω cm) for 20 at.% of Al doping. The possible mechanism behind the phenomenal zig-zag variation in resistivity with respect to Al doping is discussed in detail. The nature of conductivity changes from n-type to p-type when the Al doping level is 10 at.%. The results show that 20 at.% is the optimum doping level for good quality p-type SnO2:Al films suitable for transparent electronic devices.

Key words: Tin oxide films, P-type transparent conducting oxide (TCO), Spray pyrolysis, Transparent electronics, Electrical properties, Optical properties