Large elastic strains and ductile necking of W nanowires embedded in TiNi matrix

doi:10.1016/j.jmst.2020.04.058

Abstract

Abstract:

The deformation behaviors of W nanowires embedded in a TiNi matrix were investigated by means of in-situ synchrotron high energy X-ray diffraction (HEXRD) and in-situ transmission electron microscopy (TEM) analysis during tensile deformation. The HEXRD measurement indicated that the W nanowires exhibited an average lattice strain of about 1.50 %, whereas the TEM examination revealed a local elastic strain of about 4.59 % in areas adjacent to the TiNi matrix where stress-induced martensitic transformation occurred. This strain corresponds to a stress of ～15 GPa for the W nanowires. In addition, in areas adjacent to the TiNi matrix where plastic deformation and cracking were generated, the W nanowire showed significant ductile necking with ～80 % reduction in cross-section area. The ductile necking of W nanowire is attributed to the lack of protection from the stress-induced martensitic transformation of the TiNi matrix.

Key words: Tungsten, Nanowire, In-situ TEM, Elastic strain

Daqiang Jiang, Zhenghao Jia, Hong Yang, Yinong Liu, Fangfeng Liu, Xiaohua Jiang, Yang Ren, Lishan Cui. Large elastic strains and ductile necking of W nanowires embedded in TiNi matrix[J]. J. Mater. Sci. Technol., 2021, 60: 56-60.

Figures/Tables 6

Fig. 1. Schematic of the in-situ tensile deformation device mounted on a TEM sample holder.

Fig. 2. HEXRD measurement of the deformation behavior of the in-situ nanowire W/TiNi composite. (a) Tensile stress-strain curve of the composite (black) and the evolution of the lattice strain for W (110) planes in the direction perpendicular to the loading direction with the applied strain (blue). The inset in Fig. 2(a) is a two-dimensional HEXRD diffraction pattern of the composite prior to deformation, which shows a strong <110> texture for W nanowire. (b) XRD patterns in the composite wire axial direction (loading direction) showing the evolution of W (110) diffraction during tensile deformation. (c) 360° integrated XRD patterns showing the evolution of B19′ (001) diffraction during tensile deformation.

Fig. 3. TEM analysis of the nanowire W/TiNi composite in annealed state. (a) a HAADF-STEM micrograph. (b) a TEM micrograph.

Fig. 4. In-situ TEM analysis of the composite during tensile deformation. (a) A bright field TEM image of the nanocomposite. (b-g) SAED patterns taken from the red encircled area in (a) during tensile deformation. (h-m) Enlarged views of the SAED patterns taken from the blue boxed regions shown in panels (b-g), revealing the shift of the {110} diffraction spots during deformation. (m-p) Measured (110) d-spacing values of the strained W nanowire.

Fig. 5. Bright field TEM images of the nanowire W/TiNi composite at different d-spacing strains (a-f) of the W nanowire. Micrographs (g) and (h) are enlarged images of a local area in bright and dark field views.

Fig. 6. Bright field TEM images at low (a) and high (b) magnifications of a W nanowire in the composite after tensile deformation, revealing significant necking and plasticity.

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