[1] S. Buhl, C. Leinenbach, R. Spolenak, K. Wegener,J. Mater. Sci, 45 (2010), pp. 4358-4368 [2] A. Fissel,Phys. Rep, 379 (2003), pp. 149-255 [3] H. Matsunami, T. Kimoto,Mater. Sci. Eng. R, 20 (1997), pp. 125-166 [4] E.A. Ekimov, A.G. Gavriliuk,Appl. Phys. Lett, 77 (2000), pp. 954-956 [5] J. Qian, G. Voronin, T.W. Zerda,J. Mater. Res, 17 (2002), pp. 2153-2160 [6] S. Leparoux, C. Diot, A. Dubach, S. Vaucher,Scripta Mater, 57 (2007), pp. 595-597 [7] G.A. Voronin, C. Pantea, T.W. Zerda, K. Ejsmont,J. Appl. Phys, 90 (2001), pp. 5933-5935 [8] U.E. Klotz, C. Liu, F.A. Khalid, H.R. Elsener,Mater. Sci. Eng. A, 495 (2008), pp. 265-270 [9] P.W. Leech, X.S. Li,Wear, 271 (2011), pp. 1244-1251 [10] B.J. Ma, F. Lian,Int. J. Refract. Met. Hard Mater, 41 (2013), pp. 339-344 [11] B.J. Ma, Q. Pang, J.P. Lou,Int. J. Refract. Met. Hard Mater, 43 (2014), pp. 25-29 [12] K. Venkateswarlu, V. Rajinikanth, T. Naveen, D.P. Sinha, Atiquzzaman, A.K. Ray,Wear, 266 (2009), pp. 995-1002 [13] W. Daves, A. Krauss, N. Behnel, V. Häublein,Thin Solid Films, 519 (2011), pp. 5892-5898 [14] X.Z. Zuo, L.T. Zhang, Y.S. Liu, S.W. Li, L.F. Cheng,J. Mater. Sci. Technol, 28 (2012), pp. 793-798 [15] Y.D. Xu, L.F. Cheng, L.T. Zhang,J. Mater. Process. Technol, 101 (2000), pp. 47-51 [16] Y.V. Naidich, B.P. Umanski, I.A. Lavrinenko, Naukova Dumka, Kiev, 1988, pp. 1?136. [17] H.S. Kim, D.J. Choi,J. Am. Ceram. Soc, 82 (1999), pp. 331-337 [18] Y. Xu, L. Cheng, L. Zhang, W. Zhou,J. Mater. Sci, 34 (1999), pp. 551-555 [19] R.R. Reeber, K. Wang,J. Electron. Mater, 25 (1996), pp. 63-67 [20] S. Tang, J. Deng, W. Liu, K. Yang,Carbon, 44 (2006), pp. 2877-2882 [21] M.C. Chu, S.J. Cho, H.M. Park, K.J. Yoon, H. Ryu,Mater. Lett, 58 (2004), pp. 1313-1316 |