[1 ] M.G. Moreno-Armenta, A. Martinez-Ruiz and N. Takeuchi: Solid State Sci., 2004, 6, 9.
[2 ] U. Hahn and W. Weber: Phys. Rev. B, 1996, 53, 12684.
[3 ] F. Gulo, A. Simon, J. Kohler and R.K. Kremer: Angew. Chem. Int. Edit., 2004, 43, 2032.
[4 ] D. Wang, N. Nakamine and Y. Hayashi: J. Vac. Sci. Technol. A, 1998, 16, 2084.
[5 ] Z.G. Wu, W.W. Zhang, L.F. Bai, J. Wang and P.X. Yan: Acta Phys. Sin., 2005, 54, 1687. (in Chinese)
[6 ] J. Wang, J.T. Chen, X.M. Yuan, Z.G. Wu, B.B. Miao and P.X. Yan: J. Cryst. Growth, 2006, 286, 407.
[7 ] L. Maya: J. Vac. Sci. Technol. A, 1993, 11, 603.
[8 ] S. Terada, H. Tanaka and K. Kubota: J. Cryst. Growth, 1989, 94, 567.
[9 ] D.M. Borsa and D.O. Boerma: Surf. Sci., 2004, 548, 95.
[10] G. Soto, J.A. Diaz and W. de la Cruz: Mater. Lett., 2003, 57, 4130.
[11] J.K. Liang, F.S. Liu, Q.L. Liu, J. Luo, G.H. Rao, J. Shu, B.J. Sun and Y. Zhang: Chin. Phys., 2006, 15, 2445.
[12] L.F. Bian, W.D. Chen and C.G. Zhang: Chin. Phys., 2005, 14, 2141.
[13] P. Klug and L.E. Alexander: X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd Edn, Wiley, New York, 1974, 687.
[14] C.X. Xu, L.P. Liang and B.F. Lu: J. Rare Earths, 2006, 24, 596.
[15] D.D. Gu, Y.F. Shen and L. Zhao: Mater. Sci. Eng. A, 2007, 445-446, 316.
[16] T. Nosaka, M. Yoshitaka and A. Okamoto: Thin Solid Films, 1999, 348, 8. |