J. Mater. Sci. Technol. ›› 2022, Vol. 109: 12-19.DOI: 10.1016/j.jmst.2021.08.068
• Research Article • Previous Articles Next Articles
Chang Gaoa,1, Yu Zhaoa,c,1, Weili Lia,b,*(
), Yulong Qiaoa, Zhao Wanga, Lu Jinga, Jie Shengc, Wei-Dong Feia,d,*()
Received:2021-04-28
Revised:2021-08-17
Accepted:2021-08-30
Published:2022-05-20
Online:2021-10-31
Contact:
Weili Li,Wei-Dong Fei
About author:wdfei@hit.edu.cn (W.-D. Fei).Chang Gao, Yu Zhao, Weili Li, Yulong Qiao, Zhao Wang, Lu Jing, Jie Sheng, Wei-Dong Fei. Large linear electrostrain of acceptor-donor Co-doped ZnO films[J]. J. Mater. Sci. Technol., 2022, 109: 12-19.
Fig. 1. Surface and cross-section micrographs of Zn1-2x(FexLix)O thin films. (a, b) x = 0; (c, d) x = 0.02; (e, f) x = 0.04; (g, h) x = 0.06; (i, j) x = 0.08.
Fig. 2. Characterizations of Zn1-2x(FexLix)O thin films. (a) XRD patterns of Zn1-2x(FexLix)O thin film, (b) the expanded view of the (002) diffraction peak in Zn1-2x(FexLix)O thin films, (c) XRD patterns of (Zn1-2x(FexLix)O ceramic powders, and enlarged images of (100) and (002) peaks; (d) lattice constants (a and c), c/a ratio and (e) I(002)/I(100) intensity ratio as a function of Fe3+-Li+ doping content, obtained from powder diffraction data; (f) schematic illustration of the preferential distribution of Fe3+-Li+ pairs in doped ZnO lattice.
Fig. 3. Lattice parameters in the crystalline structures of (a) co-doped ZnO and (b) pure ZnO. (c) Electron density different around Fe3+-Li+ ions and corresponding dipole moment.
Fig. 4. Dielectric properties of pure ZnO and Zn1-2x(FexLix)O thin films, frequency dependence of (a) permittivity, (b) dielectric loss.
Fig. 5. Piezoelectric performance of Zn1-2x(FexLix)O thin films. (a) Measured and linearly fitted experimental data for d33* of as-prepared Zn1-2x(FexLix)O thin films with various content. (b) PFM micrographs and voltage amplitudes of Zn0.88(Fe0.06Li0.06)O thin film stimulated at different applied voltages such as 1.5 V, 3.5 V and 4.5 V as a typical enumeration.(Rc=122.9/16) in the PFM mode. (c) Measured and linearly fitted experimental data for the d33* of Zn0.88(Fe0.06Li0.06)O thin film in the PFM mode. (d) Schematic diagram of piezoelectric enhancement mechanism.
Fig. 6. (a) Measured and linearly fitted experimental data for d33* of thermal electrically treated Zn1-2x(FexLix)O thin films with various content. The comparison between as-prepared and thermal electrically treated thin films (b) d33*; (c) electrostrain. (d) Oriented process of Fe3+-Li+ ionic pairs during the thermo-electrically treatment.
Fig. 7. Comparison diagram of the piezoelectric performance for the representative thin films materials including BNT-based, BiFeO3-based, ZnO-based, KNN-based, lead-based.
Fig. 8. (a) Schematic diagram of in-situ XRD measurement under excitation electric field for the Fe3+-Li+ co-doped ZnO thin film. (b) 2θ angle of (002) diffraction peak under different applied DC electric field for the Zn0.88(Fe0.06Li0.06)O thin film. (c) 2θ angle of (002) diffraction peak of Zn0.88(Fe0.06Li0.06)O thin film as a function of applied DC electric field.
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