J. Mater. Sci. Technol. ›› 2024, Vol. 199: 184-196.DOI: 10.1016/j.jmst.2024.01.061
• Research article • Previous Articles Next Articles
Kesong Miaoa, Yiping Xiaa, Rengeng Lia, Emad Maawadb, Weimin Ganb, Xuewen Lia, Hao Wua, Chenglu Liua, Qing Liua, Guohua Fana,*
Received:
2023-08-07
Revised:
2023-12-17
Accepted:
2024-01-04
Published:
2024-11-10
Online:
2024-11-07
Contact:
*E-mail address: Kesong Miao, Yiping Xia, Rengeng Li, Emad Maawad, Weimin Gan, Xuewen Li, Hao Wu, Chenglu Liu, Qing Liu, Guohua Fan. Coupled study on in-situ synchrotron high-energy X-ray diffraction and in-situ EBSD on the interfacial stress gradient in layered metals[J]. J. Mater. Sci. Technol., 2024, 199: 184-196.
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