J. Mater. Sci. Technol. ›› 2022, Vol. 100: 91-100.DOI: 10.1016/j.jmst.2021.04.065
• Research Article • Previous Articles Next Articles
Nikolaus Jägera,*(
), Michael Meindlhumera, Michal Ziteka, Stefan Spora,b, Hynek Hrubyb, Farwah Nahifb, Jaakko Julinc,d, Martin Rosenthale, Jozef Keckesf,g, Christian Mittererg, Rostislav Daniela,g
Received:2020-12-07
Revised:2021-03-10
Accepted:2021-04-03
Published:2022-02-20
Online:2022-02-15
Contact:
Nikolaus Jäger
About author:*E-mail address: nikolaus.jaeger@stud.unileoben.ac.at (N. Jäger).Nikolaus Jäger, Michael Meindlhumer, Michal Zitek, Stefan Spor, Hynek Hruby, Farwah Nahif, Jaakko Julin, Martin Rosenthal, Jozef Keckes, Christian Mitterer, Rostislav Daniel. Impact of Si on the high-temperature oxidation of AlCr(Si)N coatings[J]. J. Mater. Sci. Technol., 2022, 100: 91-100.
| Cathode composition | Coating composition [at.%/wt.%] | ||||
|---|---|---|---|---|---|
| Al | Cr | Si | N | Al/Cr | |
| Al70Cr30 | 32.6/35.7 | 16.7/35.3 | 0 | 51.0/29.0 | 2.0/1 |
| Al66.5Cr28.5Si5 | 32.6/36.8 | 14.0/30.5 | 2.6/3.1 | 50.6/29.7 | 2.3/1.2 |
| Al63Cr27Si10 | 30.8/34.9 | 13.7/29.9 | 4.7/5.5 | 50.5/29.7 | 2.2/1.2 |
Table 1 Elemental composition of the coatings obtained by ERDA.
| Cathode composition | Coating composition [at.%/wt.%] | ||||
|---|---|---|---|---|---|
| Al | Cr | Si | N | Al/Cr | |
| Al70Cr30 | 32.6/35.7 | 16.7/35.3 | 0 | 51.0/29.0 | 2.0/1 |
| Al66.5Cr28.5Si5 | 32.6/36.8 | 14.0/30.5 | 2.6/3.1 | 50.6/29.7 | 2.3/1.2 |
| Al63Cr27Si10 | 30.8/34.9 | 13.7/29.9 | 4.7/5.5 | 50.5/29.7 | 2.2/1.2 |
Fig. 2. (a) DSC and (b) TG curves of AlCrN, AlCrSi2.5N and AlCrSi5N coating powders in synthetic air. Annealing temperatures for ex-situ XRD measurements of powders are given.
Fig. 3. X-ray diffractograms of (a) AlCrN, (b) AlCrSi2.5N and (c) AlCrSi5N coatings in the as-deposited state and after annealing at various temperatures in ambient air. Diffractograms with extended 2 angle are given in the supplementary Figure A.2 showing more details about the oxides formed in the Si-containing coatings after the DSC/TG experiment at 1460°C.
Figure 5. (a) SEM micrograph of the partially oxidized AlCrSi5N sample on a sapphire substrate (with included EDX line-scans), (b) phase evolution, (c) the residual stress development and (d) the FWHM values as a function of coating depth.
Fig. 6. STEM micrographs of the partially oxidized AlCrSi5N coating showing (a) an overview across the coating thickness as imaged by HAADF and EDX maps of (b) the oxide layer, (c) the transition zone and (d) the non-oxidized coating.
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