Microanalysis on the Hydrogen Ion Irradiated 50 wt pct TiC-C Films

J Mater Sci Technol ›› 2007, Vol. 23 ›› Issue (01): 127-130.

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Microanalysis on the Hydrogen Ion Irradiated 50 wt pct TiC-C Films

Hui JIANG, Yaoguang LIU, Ningkang HUANG

Key Laboratory for Radiation Physics and Technology of Education Ministry of China, Institute of Nuclear Science and Technology, Sichuan University, Chengdu 610064, China...

Received:2005-10-31 Revised:2006-03-13 Online:2007-01-28 Published:2009-10-10
Contact: Hui JIANG

Abstract

Abstract: The 50 wt pct TiC-C films were prepared on stainless steel substrates by using a technique of ion beam mixing. These films were irradiated by hydrogen ion beam with a dose of 1×1018 ions/cm2 and an energy of 5 keV. Microanalysis of X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS) were used to analyze the films before and after hydrogen ion irradiation and to study the mechanism of hydrogen resistance.

Key words: Titanium carbide, Hydrogen ion irradiation, Microanalysis

Hui JIANG, Yaoguang LIU, Ningkang HUANG. Microanalysis on the Hydrogen Ion Irradiated 50 wt pct TiC-C Films[J]. J Mater Sci Technol, 2007, 23(01): 127-130.

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Microanalysis on the Hydrogen Ion Irradiated 50 wt pct TiC-C Films

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