Fig. 1. (a) The photo of the sample for DIC test and the corresponding selected-area for observing the strain distribution; (b) The compressive stress-strain curve of the Ti-12Mo-10Zr ST sample, The different strain levels were marked with the capital letter ‘A-G’ in (b), respectively; (c) 2D full-field strain maps with the bar of strain distribution and the corresponding max of local compression strain (defined as εmax) at different strain levels (A-G); (d) The percentage of absolute values of the variations vs the strain (ε), along compression direction (length), perpendicular to compression direction (width), and the area of the selected area. The width, length and selected-area were marked at the strain ε = 0.

Fig. 2. EBSD analysis of the Ti-12Mo-10Zr as-quenched sample at compressive strain ε ≈ 0.08. (a) IPF maps. The deformation bands were marked as band-1, band-2 and band-3 in the Close-up IPF maps of selected-area on the right side of (a). The twin planes of these deformation twinning were also identified; (b) Pole figures of β matrix and 332T variants. The blue cycles indicate the common {322} plane between β matrix and 332T; (c) Image quality (IQ) maps; (d) The point-to-point and point-to-origin misorientation profiles of band-1 and band-2 marked in (a).

Fig. 3. EBSD analysis of the Ti-12Mo-10Zr as-quenched sample at strain ε ≈ 0.15. (a) IPF maps. The deformation bands were marked as band-1, band-2, band-3 and band-4 in the IPF maps. The twin planes of these deformation twinning were also identified; (b) Pole figures of β matrix, 332T variants and 2nd 332T. The blue cycles indicate the common {322} plane between β matrix and 332T (or between the 1st

Fig. 4. TEM microgaphs of the Ti-12Mo-10Zr compressed samples: (a) BF image of 332T bands (low magnification); (b) Close-up BF image of selected-area in (a); (c, d) The corresponding SAED patterns of selected-area in (b) labeled c and d with white dotted cycles, along the zone axis (ZA) [110]β; (e, f) DF images were highlighted by using marked diffraction spots in (d), respectively.

Fig. 5. TEM micrographs of the Ti-12Mo-10Zr compressed samples: (a) BF image (low magnification), the 332T bands were noted by white arrows; (b) Close-up BF image of selected-area in (a), the dislocation slip bands were also presented by yellow arrows; (c, d) The corresponding SAED patterns of selected-area in (b) labeled c and d with white dotted cycles, along the zone axis (ZA) [110]β; (e, f) DF images were highlighted by using marked diffraction spots in (d), respectively.