Misorientation and dislocation evolution in rapid residual stress relaxation by electropulsing

doi:10.1016/j.jmst.2024.05.031

J. Mater. Sci. Technol. ›› 2025, Vol. 209: 292-299.DOI: 10.1016/j.jmst.2024.05.031

• Research Article • Previous Articles Next Articles

Misorientation and dislocation evolution in rapid residual stress relaxation by electropulsing

Ayan Bhowmik^a,1, Jin Lee Tan^a,b, Yongjing Yang^a,b, Aprilia Aprilia^a,*, Nicholas Chia^c,2, Paul Williams^d, Martyn Jones^d, Wei Zhou^a,b,*

^aRolls-Royce@NTU Corporate Laboratory, Nanyang Technological University, 65 Nanyang Drive, Singapore 637460, Singapore;
^bSchool of Mechanical & Aerospace Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore;
^cRolls-Royce Singapore Pte Ltd, 1 Seletar Aerospace Crescent, Singapore 797565, Singapore;
^dRolls-Royce PLC, PO Box 31, Derby DE24 8BJ, United Kingdom

Received:2024-03-21 Revised:2024-04-29 Accepted:2024-05-10 Published:2025-02-20 Online:2024-06-01
Contact: *School of Mechanical & Aerospace Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singa- pore. E-mail addresses: aprilia@ntu.edu.sg (A. Aprilia), wzhou@cantab.net (W. Zhou)
About author:¹Present address: Department of Materials Science and Engineering, Indian Institute of Technology Delhi, Hauz Khas, New Delhi -110016, India. ²Present address: 671B Edgefield Plains, 07-521, Singapore 637143, Singapore.

Abstract

Abstract: This study investigates the effect of high current density electropulsing on the material in a rapid stress relaxation process. An AISI 1020 steel was shot-peened to induce surface compressive residual stresses in a controlled manner and subsequently electropulsed to investigate the changes in microstructure and defect configuration. AISI 1020 steel was chosen as it has a simple microstructure (plain ferritic) and composition with low alloying conditions. It is an appropriate material to study the effect of transmitting electric pulses on the microstructural defect evolution. A combination of electron-backscattered diffraction and transmission electron microscopy proved to be an effective tool in characterizing the post-electropulsing effects critically. By application of electropulsing, a reduction in the surface residual stress layer was noticed. Also, reductions in misorientation and dislocation density together with the disentanglement of dislocations within the cold-worked layer were observed after electropulsing. Additionally, the annihilation of shot-peening-induced deformation bands beyond the residual layer depth was observed. These effects have been rationalised by taking into account the various possibilities of athermal effects of electropulsing.

Key words: Electropulsing, Residual stress, Misorientation, Dislocation annihilation, TEM

Ayan Bhowmik, Jin Lee Tan, Yongjing Yang, Aprilia Aprilia, Nicholas Chia, Paul Williams, Martyn Jones, Wei Zhou. Misorientation and dislocation evolution in rapid residual stress relaxation by electropulsing[J]. J. Mater. Sci. Technol., 2025, 209: 292-299.

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Misorientation and dislocation evolution in rapid residual stress relaxation by electropulsing

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