J Mater Sci Technol ›› 2008, Vol. 24 ›› Issue (02): 145-148.

• Research Articles •     Next Articles

Growth and characterization of high-quality LiAlO2 single crystal

Taohua HUANG, Shengming ZHOU, Hao TENG, Hui LIN, Jun ZOU, Jianhua ZHOU, Jun WANG   

  1. Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China...
  • Received:2007-07-03 Revised:2007-08-08 Online:2008-03-28 Published:2009-10-10
  • Contact: Taohua HUANG

Abstract: γ-LiAlO2 single crystal is a promising substrate for GaN heteroepitaxy. In this paper, we present the growth of large-sized LiAlO2 crystal by modified Czochralski method. The crystal quality was characterized by highresolution X-ray diffraction and chemical etching. The results show that the as-grown crystal has perfect quality with the full width at half maximum (FWHM) of 17.7–22.6 arcsec and etch pits density of (0.3–2.2)×104 cm-2 throughout the crystal boule. The bottom of the crystal boule shows the best quality. The optical transmission spectra from UV to IR exhibits that the crystal is transparent from 0.2 to 5.5 μm and becomes completely absorbing around 6.7 μm wavelength. The optical absorption edge in near UV region is about 191 nm.

Key words: γ-LiAlO2 crystal, Czochralski method, Chemical etching, Transmission spectra