J Mater Sci Technol ›› 1998, Vol. 14 ›› Issue (6): 511-515.

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Relaxation Phenomenon of Te_(10)Ge_(10)Se_(80-x)Sb_x Bulk Glassy System

A.Elshafie (Physics Dept. Faculty of Science, Menoufia University Shebin El-Koom, Egypt)   

  • Received:1998-11-28 Revised:1998-11-28 Online:1998-11-28 Published:2009-10-10

Abstract: The dielectric constant and dielectric loss of Te10Ge10Se80-xSbx (x=3, 6, 12 at. pct) chalcogenide alloys were measured in the temperature range (300 to 453 K) and the frequency range (100 Hz to 100 kHz). The real dielectric constant ∈′and imaginary dielectric constant ∈" show a decrease with increasing frequency and an increase with increasing temperature. All samples display dielectric dispersion. Both ∈′ and ∈" show a Debye relaxation type. The enthalpy activation energy ΔH and activation energy WH were calculated. Cole-Cole diagram consists of an arc of semicircle shifted from the origin and its center below the real axis at high frequency