[1] A.Y.Liu and M.L.Cohen: Science, 1989, 245, 841. [2] H.Sjotrom, I.Ivanov, M.Johansson, L.Hultman,J-E. Sundgren, S.V.Hainsworth, T.F.Page and L.R.Wallenberg: Thin Solid Films, 1994, 246, 103. [3] D.Marton, K.J.Boyed, A.H.H-Bayati, S.S.Tordorv and J.W.Rabalais: Phys. Rev. Lett., 1994, 73, 118. [4] A.Hoffman and I.Gouzman: Appl. Phys. Lett., 1994,64,845. [5] K.M.Yu, M.L.Cohen, E.E.Haller, W.L.Hansen,A.Y.Liu and I.C.Wu: Phys. Rev., 1994, B49, 5034. [6] X.A.Zhao, C.W.Ong, Y.C.Tsang, Y.W.Wong,P.W.Chan and C.L.Choy: Appl. Phys. Lett., 1995,66, 2652. [7] C.Niu, Y.Z.Yu and C.M.Lieber: Science, 1993, 261,334. [8] A.Bousetta, M.Lu, A.Bensaonla and A.Schultz: Appl.Phys. Lett., 1994, 65, 696. [9] S.Kumar and T.L.Tansley: Solid State Commun.,1993, 83, 803. [10] J.P.Riviere, D.Texier, J.Delafond, M.Jaouen,E.L.Mathe and J.Chatumont: Mater. Lett., 1995,22, 115. [11] S.S.Todorov, D.Marton, K.J.Boyad, A.H.Al-Bayati and J.W.Rabalais: J. Vac. Sci. Technol., 1994, A12,3192. [12] D.Li, S.Lopez, Y.W.Chung, M.S.Wong and D.Sproul:J. Vac. Sci. Technol., 1995, A13, 1063. |