J Mater Sci Technol ›› 1992, Vol. 8 ›› Issue (3): 157-162.

• Articles •     Next Articles

Surface Characterization of Ni_(64)P_(20)Fe_(16)Amorphous Alloy by X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy

By JIANG Honggang WANG Jingtang DING Bingzhe State Key Laboratory for RSA,Institute of Metal Research,Academia Sinica,Shenyang,110015,ChinaTo whom correspondence should be addressed   

  • Received:1992-05-28 Revised:1992-05-28 Online:1992-05-28 Published:2009-10-10

Abstract: The nature of the native oxides formed on the surface layer of amorphous alloy Ni_(64)P_(20)Fe_(16)has been studied by X-ray photoelectron spectroscopy (XPS)and Auger electron spectroscopy(AES)with depth profiling by ion bombardment.There are great distinctions in compositions and chemical states between the surface layer and the bulk.The main constituents Ni,P and Fe are lower in the sur- face layer,and they are mostly in oxidized states, whereas C,O and N are enriched in the surface lay- er.The thickness of surface oxide layer is approximately 20 nm,this layer was assumed to be of great significance to various properties of amor- phous alloy Ni_(64)P_(20)Fe_(16),expecially to the chemical and catalytic properties.Experiments proved that transitional element Fe cannot improve oxidation resistance of the amorphous Ni-P system.

Key words: amorphous alloy Ni_(64)P_(20)Fe_(16), surface layer composition, chemical state