J. Mater. Sci. Technol. ›› 2024, Vol. 197: 1-8.DOI: 10.1016/j.jmst.2024.01.070

Special Issue: Ceramics 2024 Electronic materials 2024

• Research Article •     Next Articles

Structure evolution and τf influence mechanism of Bi1-xHoxVO4 microwave dielectric ceramics for LTCC applications

Huaicheng Xianga,b,*, Yuheng Zhanga, Junqi Chenc, Yang Zhoua, Ying Tanga,b, Jinwu Chenc,*, Liang Fangb,*   

  1. aKey Laboratory of Low-Dimensional Structural Physics and Application, Education Department of Guangxi Zhuang Autonomous Region, College of Physics and Electronic Information Engineering, Guilin University of Technology, Guilin, 541004, China;
    bGuangxi Universities Key Laboratory of Non-Ferrous Metal Oxide Electronic Functional Materials and Devices, Guangxi Key Laboratory of Optical and Electronic Materials and Devices, College of Materials Science and Engineering, Guilin University of Technology, Guilin, 541004, China;
    cSchool of Mechanical Engineering, Guilin University of Aerospace Technology, Guilin, 541004, China
  • Received:2024-01-02 Revised:2024-01-23 Accepted:2024-01-24 Published:2024-10-20 Online:2024-10-15
  • Contact: *E-mail addresses: xianghc@glut.edu.cn (H. Xiang), cnchenjw@guat.edu.cn (J. Chen), fanglianggl001@aliyun.com (L. Fang)

Abstract: Bi1-xHoxVO4 (0.1 ≤ x ≤ 0.9) ceramics were prepared via a solid-state reaction method, and all the ceramics could be well densified in the 920-980 °C range. The ceramics with 0.1 ≤ x < 0.4 were composed of both monoclinic scheelite (M) and tetragonal zircon (T) phases, and a single M phase could be obtained in the range of x ≥ 0.4. The measured εr decreased from 58.9 (x = 0.1) to 14.7 (x = 0.9), so do the calculated values (εr(C - M) = 34.3-12.1), and the main reason for εr > εr(C - M) was the rattling of Ho3+ in the dodecahedron. Two points with zero τf appeared in Bi1-xHoxVO4 (0 ≤ x ≤ 1) ceramics, and the best microwave dielectric properties with εr = 16.6, Q × f = 18,400 GHz (f = 10.69 GHz), and τf = +3.29 ppm/°C were obtained in the Bi0.2Ho0.8VO4 ceramic. The change in temperature coefficient of ionic polarizability (ταm) caused by the rattling effect of cations is the physical essence that affects τf. Therefore, the rattling effect can be used as an effective mechanism to regulate τf in low-εr materials. Furthermore, there was no chemical reaction between Bi1-xHoxVO4 and Ag electrode, which indicates potential applications in low-temperature co-fired ceramic (LTCC) technology.

Key words: Bi1-xHoxVO4, Near-zero τf;, Bond valence, Rattling effect, LTCC