J Mater Sci Technol ›› 2003, Vol. 19 ›› Issue (02): 157-160.

• Research Articles • Previous Articles     Next Articles

XPS Analysis of the Cerium Conversion Coating on the Anodized Al6061/SiCp

Xingwen YU, Chuanwei YAN, Chunan CAO, Guoqiang LI   

  1. Department of Interface Chemistry and Surface Technologies, Max-Planck-Institut for Iron Research, Max-Planck-Str. 1, 40237 Duesseldorf, Germany...
  • Received:1900-01-01 Revised:1900-01-01 Online:2003-03-28 Published:2009-10-10
  • Contact: Xingwen YU

Abstract: A method of concentration analysis based on X-ray photoelectron spectroscopy (XPS) results was introduced. The concentration of Ce-rich conversion coating on the anodized Al based metal matrix composites Al6061/SiCp was then studied according to this method. The results revealed that the Ce conversion coating on the anodized Al6061/SiCp consisted of Al oxide, Ce oxide and Ce hydroxide. The state of Ce element exhibited the mixture of Ce3+ and Ce4+. Some of CeIII was oxidized to be CeIV in the outer layer coating.

Key words: Ce-rich conversion coating, X-ray photoelectron spectroscopy, Anodization, Al6061/SiCp