[1] Y.Tawada, K.Tsugae, M.Kondo, H.O.Kamoto andY.Hamakawa: J. Appl. Pha., 1982, 53, 527. [2] R.Dutta, R.K.Banerjee and S.S.Ultra: PIsys. So1idState, 1983, 59, 581. [3] L.Aggour, E.Fitzer, M.Heym and E.Ignatowitz: ThinSolid Films, 1977, 40, 97. [4] Y.Hirohato, M.Kobayashi, S.Maeda, K.Nakamura,M.Mori, K.Watanabe and T.Yamashin: Thin SolidFilms, 1979, 63, 237. [5] Y.Matsumoto, G.Hirata, H.Takakura, H.Okamoto andY.Hamakawa: J. Appl. Phys., 1990, 67, 6538. [6] W.S.Yoo and H.Matsunami: J. Appl. Phys., 1991, 70,11. [7] M.I.Chaudhry and R.L.Wright: J. Mater. Res., 1990,5, 1595. [8] J.A.Powell, D.J.Larkin, L.C.Matus, J.I.Bradshaw,L.Henderson, J.Yang and P.Pirouz: Appl. Phys.Lett., 1990, 56, 1442. [9] Y.Onuma, F.Nagaune and K.Kamimura: Amorphousand Crystalline Silicon Carbide and Helated Miterials,eds. G.L.Harris and C.Y.W.Yang, Springer Publish-ers, Berlin, 1989. [10] J.A.Borders, S.T.Picraux and W.Beezhold: Appl.Phys. Lett., 1971, 18, 509. [11] P.Durupit, B.Canut, J.P.Ganthier, J.A.Roger andJ.Pivot: Mater. Res. Bull., 1989, 15, 1557. [12] F.Bozso, L.Muchlhoff, M.Trenary, W.J.Choyke andJ.T.Vates: J. Vac. Sci. & Technol., 1984, A2, 1271. [13] Y.Mizokawa, S.Nakanishi and S.Miyasae: Jpn. J.Appl. Phys., 1989, 28, 2570. [14] W.S.Yoo and H.Matsunami: Jpn. J. Appl. Phys.,1991, 30, 545. [15] W.F.Knippenberg and G.Verspui: Mater. Res. Bull.,1969, 4, 545. [16] J.A.Savage: J. Cryst. Growth, 1991, 113, 698.l |