J. Mater. Sci. Technol. ›› 2007, Vol. 23 ›› Issue (04): 504-508.

• 论文 • 上一篇    下一篇

Microstructure Control of Nanoporous Silica Thin Film Prepared by Sol-gel Process

肖轶群   

  1. 同济大学波耳固体物理研究所
  • 收稿日期:2006-06-12 修回日期:2006-10-23 出版日期:2007-07-28 发布日期:2009-10-10

Microstructure Control of Nanoporous Silica Thin Film Prepared by Sol-gel Process

Yiqun XIAO, Jun SHEN, Zhiyong XIE, Bin ZHOU, Guangming WU   

  1. Pohl Institute of Solid State Physics, Tongji University, Shanghai 200092, China
  • Received:2006-06-12 Revised:2006-10-23 Online:2007-07-28 Published:2009-10-10
  • Contact: Jun SHEN

关键词: Sol-gel, Nanoporous, Microstructure, Optica

Abstract: Nanoporous silica films were prepared by sol-gel process with base, acid and base/acid two-step catalysis. Transmission electron microscope (TEM) and particle size analyzer were used to characterize the microstructure and the particle size distribution of the sols. Scanning electron microscopy (SEM), atomic force microscopy (AFM) and spectroscopic ellipsometer were used to characterize the surface microstructure and the optical properties of the silica films. Stability of the sols during long-term storage was investigated. Moreover, the dispersion relation of the optical constants of the silica films, and the control of the microstructure and properties of the films by changing the catalysis conditions during sol-gel process were also discussed.

Key words: Sol-gel, Nanoporous, Microstructure, Optical constants