J. Mater. Sci. Technol. ›› 1992, Vol. 8 ›› Issue (6): 397-400.
ZHOU Yanchun ZHOU Jing CHANG Xin XIA Fei SHI Changxu ** Institute of Metal Research,Academia Sinica,Shenyang,110015,China+ To whom correspondence should be addressed
ZHOU Yanchun ZHOU Jing CHANG Xin XIA Fei SHI Changxu ** Institute of Metal Research,Academia Sinica,Shenyang,110015,China+ To whom correspondence should be addressed
摘要: <正> The microstructure of both {10(?)1} and{10(?)0} (directions perpendicular to the {10(?)1}and {10(?)0} planes) α-Si_3N_4 whiskers were investi-gated by high resolution electron microscopy(HREM).On one side of the {10(?)1}α-Si_3N_4 whiskers many planar defects were ob-served,two kinds of micrograins on one side of the{10(?)0} whiskers were found.In one type,sepa-rated α-Si_3N_4 (28 H) micrograins had the sameorientation with respect to the matrix whisker;inthe other type,connected polymicrograins consistedof both α-and β-Si_3N_4 (14H).