.

Fig. 5.. (a) The atomic-scale HAADF-STEM image of a semicoherent interface on an edge-on θ' precipitate viewed along [100]_α. The inserted image shows the intensity variation of the selected layer in the matrix. (b) The selected area in (a) showing the important transition region. Simulated images for θ'_T2 and θ' cell are overlaid in the image. Some Al atoms are marked by green circles. (c, d) Intensity profiles of A and B planes, with the different intensities representing different atomic columns. The significant reduction of intensity was marked by the green arrows.