Integration of machine learning with phase field method to model the electromigration induced Cu6Sn5 IMC growth at anode side Cu/Sn interface
Anil Kunwara,*(
), Yuri Amorim Coutinhoa, Johan Hektorb,c, Haitao Mad, Nele Moelansa
), Yuri Amorim Coutinhoa, Johan Hektorb,c, Haitao Mad, Nele Moelansa
.
Fig. 7.. Pairplot of the effective charge numbers of the Cu component in each phase (ZCufcc,ZCuimc,ZCuliq) and growth rate constant (knmps, kem in nm/s) for two ranges of current density (j in A/mm2).
