Integration of machine learning with phase field method to model the electromigration induced Cu6Sn5 IMC growth at anode side Cu/Sn interface
Anil Kunwara,*(
), Yuri Amorim Coutinhoa, Johan Hektorb,c, Haitao Mad, Nele Moelansa
), Yuri Amorim Coutinhoa, Johan Hektorb,c, Haitao Mad, Nele Moelansa
.
Fig. 2.. Experimental setup at beamline BL13W1 of SSRF for obtaining in-situ synchrotron radiation (SR) radiography images of electromigration tests at T = 523.15 K, is schematically sketched in (i). Asymmetrical growth of anode based IMC phase at t = (a) 5, (b) 10, (c) 25, and (d) 45 min for Cu/Sn/Cu joint undergoing electromigration can be clearly noticed in (ii).
