Integration of machine learning with phase field method to model the electromigration induced Cu6Sn5 IMC growth at anode side Cu/Sn interface
Anil Kunwara,*(
), Yuri Amorim Coutinhoa, Johan Hektorb,c, Haitao Mad, Nele Moelansa
), Yuri Amorim Coutinhoa, Johan Hektorb,c, Haitao Mad, Nele Moelansa
.
Fig. 13.. Evolution of the IMC grains Gr 1 and Gr 2 for j=(a) 2 × 106 A/m2, and (b) 10 × 106 A/m2 visualized using a color plot of the functionΣi(ηi)2.
