Integration of machine learning with phase field method to model the electromigration induced Cu6Sn5 IMC growth at anode side Cu/Sn interface
Anil Kunwara,*(
), Yuri Amorim Coutinhoa, Johan Hektorb,c, Haitao Mad, Nele Moelansa
), Yuri Amorim Coutinhoa, Johan Hektorb,c, Haitao Mad, Nele Moelansa
.
Fig. 12.. The distribution of electric field potential ? corresponding to IMC evolution profiles at j = 2 × 106 A/m2 at t = 0.59 s.
