Integration of machine learning with phase field method to model the electromigration induced Cu6Sn5 IMC growth at anode side Cu/Sn interface
Anil Kunwara,*(
), Yuri Amorim Coutinhoa, Johan Hektorb,c, Haitao Mad, Nele Moelansa
), Yuri Amorim Coutinhoa, Johan Hektorb,c, Haitao Mad, Nele Moelansa
.
Fig. 10.. Optimized effective charge numbers for Cu and Sn in FCC (a), IMC (b), and LIQUID (c) phase. The growth rate constants as a function of current density are shown in (d), in which the red line represents the experimental values whereas black line corresponds to the values predicted from optimization of neural network.
