Integration of machine learning with phase field method to model the electromigration induced Cu6Sn5 IMC growth at anode side Cu/Sn interface

Anil Kunwar, Yuri Amorim Coutinho, Johan Hektor, Haitao Ma, Nele Moelans

Table 2 Model parameters and material properties used in the multi-phase field simulation.

Properties Values Dliq 4.95 × 10-10 m2/s Dfcc 3.09 × 10-16 m2/s Dimc 4.07 × 10-15 m2/s Dgb 8.0 × 10-13 m2/s Na 6.022 × 1023 mol-1 σ 0.5 J/m2 grid space 1D (Δx) 1.43 × 10-9 m δ (1D) 1.0 × 10-8 m m (1D) 3.0 × 108 J/m3 κ (1D) 5.3625 × 10-10 J/m grid space 2D (Δx = Δy) 3.75 × 10-9 m δ (2D) 2.5 × 10-8 m m (2D) 1.2 × 108 J/m3 κ (2D) 9.375 × 10-10 J/m ρSn 1.10 × 10-7 Ωm ρCu 1.70 × 10-8 Ωm ρIMC 1.75 × 10-7 Ωm