Jia Li a, Haotian Chen a, Hui Feng a, Qihong Fang a,*( ), Yong Liu b, Feng Liu b,*( ), Hong Wu b, Peter K Liaw c,*( )
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Fig. 7.. The stress distribution at the strain of 20% and different materials: the crystalline HEA (a), amorphous HEA layer with 3?nm (b), amorphous HEA layer with 6?nm (c), amorphous HEA layer with 9?nm (d), amorphous HEA layer with 12?nm (e), and amorphous HEA (f). Dotted line represents the interface.
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