Chaoyu Han a, Shibo Wen a, Feng Ye a,*( ), Wenjia Wu b, Shaowei Xue a, Yongfeng Liang a, Binbin Liu a, Junpin Lin a
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Fig. 10.. TEM micrographs before deformation of the samples after heat treatment of FC and BQ. After FC: (a) SAED patterns along [011] zone axis, Arrow A designates (200), and arrow B designates (111); (b) Dark field image obtained using (200) spot with arrows designating anti-phase boundary (APB); (c) Dark field image obtained using (111) spot. After BQ: (d) SAED patterns along the [011] zone axis; (e) Dark field image obtained using (200) spot.
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