Characterization of Microstructural and Morphological Properties in As-deposited Ta/NiFe/IrMn/CoFe/Ta Multilayer System
Öksüzoğlu Ramis Mustafa1,*, Sarac Umut2, Yıldırım Mustafa1, Çınar Hakan1
Fig. 9. Angular AFM spectrum for the S2 sample with Ta layer thickness of 6 nm: a amplitude, b correlation length plot.