Characterization of Microstructural and Morphological Properties in As-deposited Ta/NiFe/IrMn/CoFe/Ta Multilayer System
Öksüzoğlu Ramis Mustafa1,*, Sarac Umut2, Yıldırım Mustafa1, Çınar Hakan1
Fig. 8. Angular AFM spectrum for the S1 sample with NiFe layer thickness of 8 nm: a amplitude, b correlation length plot.