Characterization of Microstructural and Morphological Properties in As-deposited Ta/NiFe/IrMn/CoFe/Ta Multilayer System

Öksüzoğlu Ramis Mustafa^1,^*, Sarac Umut², Yıldırım Mustafa¹, Çınar Hakan¹

Fig. 7. Evolution of the RMS surface roughness as a function of the NiFe seed a, and Ta buffer layers thicknesses b. All lines are guide for the eye.