Characterization of Microstructural and Morphological Properties in As-deposited Ta/NiFe/IrMn/CoFe/Ta Multilayer System
Öksüzoğlu Ramis Mustafa1,*, Sarac Umut2, Yıldırım Mustafa1, Çınar Hakan1
Fig. 6. AFM topographic images of S2 samples with the thickness of the Ta buffer layer: a 2 nm, b 6 nm scan scale of 1 μm × 1 μm.