Characterization of Microstructural and Morphological Properties in As-deposited Ta/NiFe/IrMn/CoFe/Ta Multilayer System
Öksüzoğlu Ramis Mustafa1,*, Sarac Umut2, Yıldırım Mustafa1, Çınar Hakan1
Fig. 4. Variation of the dislocation density a as a function of the NiFe seed, b Ta buffer layers thicknesses. All lines are guide for the eye.