Thermal Stability of ALD Lanthanum Aluminate Thin Films on Si (100)
She Xiaofeng, Wang Hongtao*
Fig. 3. a Cross-sectional TEM image and b HAADF-STEM image of the annealed 900 °C, 1 min La 1.1 Al 0.9 O 3 film on Si, c HRTEM image of the interfacial layer, d low magnification TEM image.