Characterisation of Photocathodes Based on Pb Thin Film Deposited by UV Pulsed Laser Ablation
Gontad Francisco1,*, Lorusso Antonella2, Gatti Giancarlo3, Ferrario Massimo3, Passione Laura Gioia4,5, Persano Luana6, Lovergine Nicola5, Perrone Alessio2
Fig. 5. a XRD pattern recorded for a Pb film as-deposited onto Nb; b and c powder diffraction pattern of cubic Pb ICPDS, Card No. 04-0686 and Nb ICPDS Card No. 34-0370, respectively [26] and [27] . The peak intensities are normalised to the 111 and 110 most intense peaks for Pb and Nb, respectively.