Characterisation of Photocathodes Based on Pb Thin Film Deposited by UV Pulsed Laser Ablation

Gontad Francisco^1,^*, Lorusso Antonella², Gatti Giancarlo³, Ferrario Massimo³, Passione Laura Gioia^4,⁵, Persano Luana⁶, Lovergine Nicola⁵, Perrone Alessio²

Fig. 4. a XRD pattern recorded for a Pb film as-deposited onto Si 100. The 200 and 400 peaks due to the crystalline Si substrate are indicated in the figure; peaks marked with an asterisk * could be ascribed to lead silicates; b powder diffraction pattern of cubic Pb ICPDS, Card No. 04-0686, peak intensities are normalised to the 111 most intense peak.