Characterization, Removal and Evaluation of Oxide Film in the Diffusion Bonding of Zr55Cu30Ni5Al10 Bulk Metallic Glass
Chen Haiyan1, Cao Jian1,*, Song Xiaoguo2, Liu Jiakun1, Feng Jicai1,2
Fig. 1. Overall XPS spectrum of as-cast Zr 55 Cu 30 Ni 5 Al 10 BMG after ion etching for 0, 20, 30, 40, 50, 70, 90, 120, 150, 270 and 570 s.