J Mater Sci Technol ›› 2005, Vol. 21 ›› Issue (03): 311-314.

• Research Articles • Previous Articles     Next Articles

In Situ Scanning-Tunneling-Microscope Observation on Dissolution of a Cu-20Zr Film

Haibo LU, Guoze MENG, Ying LI, Fuhui WANG   

  1. State Key Laboratory for Corrosion & Protection, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China
  • Received:2004-10-26 Revised:2004-12-07 Online:2005-05-28 Published:2009-10-10
  • Contact: Ying LI

Abstract: A nanocrystalline coating of Cu-20Zr (in wt~pct) was obtained on glass by magnetron sputtering. The corrosion behavior of the Cu-20Zr film in 0.001 mol/L HCl solution was investigated using potentiodynamic polarization and in situ electrochemical scanning-tunneling-microscopy (ECSTM). Results demonstrated that the film exhibits active behavior. Microscopic pitting corrosion and tunneling are caused by localized electrodissolution of Zr atoms and the diffusion of Cu atoms at surface defects.

Key words: Magnetron sputtering, Film, Potentiodynamic polarization, ECSTM